Deployment of an FMEA-Integrated Framework to Improve Operational Performance in Semiconductor Manufacturing: A Case Study
The failure mode effect analysis (FMEA) aims to strengthen the operational performance of a process of a product. However, current FMEA practice does not quantify the achievement in operational performances. Risk priority number (RPN), the only success indicator of FMEA, is independent of operationa...
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Institute of Physics Publishing
2019
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my.utp.eprints.235732021-08-19T07:56:30Z Deployment of an FMEA-Integrated Framework to Improve Operational Performance in Semiconductor Manufacturing: A Case Study Liew, C.F. Prakash, J. Kamaruddin, S. Ong, K.S. The failure mode effect analysis (FMEA) aims to strengthen the operational performance of a process of a product. However, current FMEA practice does not quantify the achievement in operational performances. Risk priority number (RPN), the only success indicator of FMEA, is independent of operational performance monitoring. Thus, the capability of FMEA to strengthen operational performance may be ineffectual unless it demonstrates a quantifiable improvement in operational performance. This study offered guidelines for manufacturing industry to quantify the operational performance within the FMEA methodology by operational performance indicator (OPI). In tandem with RPN, the OPI in FMEA ascertains the priority set by RPN and defines more refined priority than RPN. Design for manufacturing and assembly (DFMA) and Poka-yoke provide systematic guidelines for developing corrective actions for eliminating or reducing the occurrence of failure while strengthening current control to prevent the delivery of any non-conformance to customers. Application of the new FMEA-based integrated framework in a semiconductor manufacturer in Malaysia demonstrated that 69.2 improved the overall equipment efficiency (OEE). © 2019 IOP Publishing Ltd. All rights reserved. Institute of Physics Publishing 2019 Conference or Workshop Item NonPeerReviewed https://www.scopus.com/inward/record.uri?eid=2-s2.0-85070247823&doi=10.1088%2f1757-899X%2f530%2f1%2f012040&partnerID=40&md5=bdc9e9345d64137983d8d911e1b68b7a Liew, C.F. and Prakash, J. and Kamaruddin, S. and Ong, K.S. (2019) Deployment of an FMEA-Integrated Framework to Improve Operational Performance in Semiconductor Manufacturing: A Case Study. In: UNSPECIFIED. http://eprints.utp.edu.my/23573/ |
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The failure mode effect analysis (FMEA) aims to strengthen the operational performance of a process of a product. However, current FMEA practice does not quantify the achievement in operational performances. Risk priority number (RPN), the only success indicator of FMEA, is independent of operational performance monitoring. Thus, the capability of FMEA to strengthen operational performance may be ineffectual unless it demonstrates a quantifiable improvement in operational performance. This study offered guidelines for manufacturing industry to quantify the operational performance within the FMEA methodology by operational performance indicator (OPI). In tandem with RPN, the OPI in FMEA ascertains the priority set by RPN and defines more refined priority than RPN. Design for manufacturing and assembly (DFMA) and Poka-yoke provide systematic guidelines for developing corrective actions for eliminating or reducing the occurrence of failure while strengthening current control to prevent the delivery of any non-conformance to customers. Application of the new FMEA-based integrated framework in a semiconductor manufacturer in Malaysia demonstrated that 69.2 improved the overall equipment efficiency (OEE). © 2019 IOP Publishing Ltd. All rights reserved. |
format |
Conference or Workshop Item |
author |
Liew, C.F. Prakash, J. Kamaruddin, S. Ong, K.S. |
spellingShingle |
Liew, C.F. Prakash, J. Kamaruddin, S. Ong, K.S. Deployment of an FMEA-Integrated Framework to Improve Operational Performance in Semiconductor Manufacturing: A Case Study |
author_facet |
Liew, C.F. Prakash, J. Kamaruddin, S. Ong, K.S. |
author_sort |
Liew, C.F. |
title |
Deployment of an FMEA-Integrated Framework to Improve Operational Performance in Semiconductor Manufacturing: A Case Study |
title_short |
Deployment of an FMEA-Integrated Framework to Improve Operational Performance in Semiconductor Manufacturing: A Case Study |
title_full |
Deployment of an FMEA-Integrated Framework to Improve Operational Performance in Semiconductor Manufacturing: A Case Study |
title_fullStr |
Deployment of an FMEA-Integrated Framework to Improve Operational Performance in Semiconductor Manufacturing: A Case Study |
title_full_unstemmed |
Deployment of an FMEA-Integrated Framework to Improve Operational Performance in Semiconductor Manufacturing: A Case Study |
title_sort |
deployment of an fmea-integrated framework to improve operational performance in semiconductor manufacturing: a case study |
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Institute of Physics Publishing |
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2019 |
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https://www.scopus.com/inward/record.uri?eid=2-s2.0-85070247823&doi=10.1088%2f1757-899X%2f530%2f1%2f012040&partnerID=40&md5=bdc9e9345d64137983d8d911e1b68b7a http://eprints.utp.edu.my/23573/ |
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13.223943 |