Reliability analysis of junctionless fin field effect transistor (JL-FinFET)
When scaling down of transistors reaches below 20nm, the reliability of a device becomes more important due to the device’s needs to sustain its performance while also being able to endure reliability degradation effects. Junctionless Fin Field Effect Transistor (JL-FinFET) provides a solution for c...
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| Format: | Thesis |
| Language: | English |
| Published: |
2022
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| Online Access: | http://eprints.utm.my/id/eprint/99542/1/MuhammadNaziiruddinHamzahMSKE2022.pdf http://eprints.utm.my/id/eprint/99542/ http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:149953 |
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