Gate-all-around floating gate (gaa-fg) with variable oxide thickness for nonvolatile memory
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my.utm.835702019-10-23T03:17:04Z http://eprints.utm.my/id/eprint/83570/ Gate-all-around floating gate (gaa-fg) with variable oxide thickness for nonvolatile memory Alias, Nurul Ezaila Bahrudin, Muhammad Faris TK Electrical engineering. Electronics Nuclear engineering 2018 Conference or Workshop Item PeerReviewed Alias, Nurul Ezaila and Bahrudin, Muhammad Faris (2018) Gate-all-around floating gate (gaa-fg) with variable oxide thickness for nonvolatile memory. In: Proceedings of 2018 Electrical Engineering Symposium (EES2018), 2018. |
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TK Electrical engineering. Electronics Nuclear engineering Alias, Nurul Ezaila Bahrudin, Muhammad Faris Gate-all-around floating gate (gaa-fg) with variable oxide thickness for nonvolatile memory |
format |
Conference or Workshop Item |
author |
Alias, Nurul Ezaila Bahrudin, Muhammad Faris |
author_facet |
Alias, Nurul Ezaila Bahrudin, Muhammad Faris |
author_sort |
Alias, Nurul Ezaila |
title |
Gate-all-around floating gate (gaa-fg) with variable oxide thickness for nonvolatile memory |
title_short |
Gate-all-around floating gate (gaa-fg) with variable oxide thickness for nonvolatile memory |
title_full |
Gate-all-around floating gate (gaa-fg) with variable oxide thickness for nonvolatile memory |
title_fullStr |
Gate-all-around floating gate (gaa-fg) with variable oxide thickness for nonvolatile memory |
title_full_unstemmed |
Gate-all-around floating gate (gaa-fg) with variable oxide thickness for nonvolatile memory |
title_sort |
gate-all-around floating gate (gaa-fg) with variable oxide thickness for nonvolatile memory |
publishDate |
2018 |
url |
http://eprints.utm.my/id/eprint/83570/ |
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1651866722850832384 |
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13.211869 |