Characterization of cadmium sulfide/titania heterostructure films by utilizing microstructure and optical characteristics

Engineering and controlling the bandgap of semiconducting metal oxide (TiO2) to enhance photoactivity under visible light is challenging. Impact of the changing CdS thickness (50-150 nm) on the structure and optical properties of the CdS/TiO2 heterostructure films (HSFs) which fabricated by pulsed l...

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Main Authors: Mohsin, Ali Kame, Bidin, Noriah, Aadim, Kadhim Abdulwahid
Format: Article
Published: Elsevier Ltd 2016
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Online Access:http://eprints.utm.my/id/eprint/73935/
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84949032734&doi=10.1016%2fj.mssp.2015.10.031&partnerID=40&md5=8991ee67453af5e64774537143173553
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spelling my.utm.739352017-11-22T12:07:38Z http://eprints.utm.my/id/eprint/73935/ Characterization of cadmium sulfide/titania heterostructure films by utilizing microstructure and optical characteristics Mohsin, Ali Kame Bidin, Noriah Aadim, Kadhim Abdulwahid Q Science (General) Engineering and controlling the bandgap of semiconducting metal oxide (TiO2) to enhance photoactivity under visible light is challenging. Impact of the changing CdS thickness (50-150 nm) on the structure and optical properties of the CdS/TiO2 heterostructure films (HSFs) which fabricated by pulsed laser deposition (PLD) was observed. XRD, FE-SEM, AFM, UV-vis and PL spectroscopy measurements were utilized to characterize structural and optical behaviors of the films. XRD measurement shows gradual increments of the lattice constants of the films with the increase of CdS thickness. The mean values of the calculated lattice constants and cell volume (V) were a=b=0.3785 nm, c=0.9475 nm and V=13.58 nm3 respectively. The average of crystallite sizes estimated for TiO2 and CdS/TiO2 at various CdS thickness is 12.20, 13.49, 24.24 and 43.10 nm. FESEM images prove the high quality nanocrystalline nature of the films without cracks and dislocation. The root means square roughness of the films was increased with the increase of CdS thickness as showed by AFM images. UV-vis measurement reveals an improvement in the optical absorbance of HSFs in the range of 380-550 nm due to presence of CdS. Interestingly, the PL intensity was enhanced by a factor of nineteen compare to pure TiO2 attributed to the charge carrier recombination in the band gap. The current results suggest that possibility to improve the optical and structural properties of the TiO2 films and also it possible to fabricate high quality CdS/TiO2 HSFs by variation of the CdS thickness. Elsevier Ltd 2016 Article PeerReviewed Mohsin, Ali Kame and Bidin, Noriah and Aadim, Kadhim Abdulwahid (2016) Characterization of cadmium sulfide/titania heterostructure films by utilizing microstructure and optical characteristics. Materials Science in Semiconductor Processing, 42 . pp. 319-325. ISSN 1369-8001 https://www.scopus.com/inward/record.uri?eid=2-s2.0-84949032734&doi=10.1016%2fj.mssp.2015.10.031&partnerID=40&md5=8991ee67453af5e64774537143173553
institution Universiti Teknologi Malaysia
building UTM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Malaysia
content_source UTM Institutional Repository
url_provider http://eprints.utm.my/
topic Q Science (General)
spellingShingle Q Science (General)
Mohsin, Ali Kame
Bidin, Noriah
Aadim, Kadhim Abdulwahid
Characterization of cadmium sulfide/titania heterostructure films by utilizing microstructure and optical characteristics
description Engineering and controlling the bandgap of semiconducting metal oxide (TiO2) to enhance photoactivity under visible light is challenging. Impact of the changing CdS thickness (50-150 nm) on the structure and optical properties of the CdS/TiO2 heterostructure films (HSFs) which fabricated by pulsed laser deposition (PLD) was observed. XRD, FE-SEM, AFM, UV-vis and PL spectroscopy measurements were utilized to characterize structural and optical behaviors of the films. XRD measurement shows gradual increments of the lattice constants of the films with the increase of CdS thickness. The mean values of the calculated lattice constants and cell volume (V) were a=b=0.3785 nm, c=0.9475 nm and V=13.58 nm3 respectively. The average of crystallite sizes estimated for TiO2 and CdS/TiO2 at various CdS thickness is 12.20, 13.49, 24.24 and 43.10 nm. FESEM images prove the high quality nanocrystalline nature of the films without cracks and dislocation. The root means square roughness of the films was increased with the increase of CdS thickness as showed by AFM images. UV-vis measurement reveals an improvement in the optical absorbance of HSFs in the range of 380-550 nm due to presence of CdS. Interestingly, the PL intensity was enhanced by a factor of nineteen compare to pure TiO2 attributed to the charge carrier recombination in the band gap. The current results suggest that possibility to improve the optical and structural properties of the TiO2 films and also it possible to fabricate high quality CdS/TiO2 HSFs by variation of the CdS thickness.
format Article
author Mohsin, Ali Kame
Bidin, Noriah
Aadim, Kadhim Abdulwahid
author_facet Mohsin, Ali Kame
Bidin, Noriah
Aadim, Kadhim Abdulwahid
author_sort Mohsin, Ali Kame
title Characterization of cadmium sulfide/titania heterostructure films by utilizing microstructure and optical characteristics
title_short Characterization of cadmium sulfide/titania heterostructure films by utilizing microstructure and optical characteristics
title_full Characterization of cadmium sulfide/titania heterostructure films by utilizing microstructure and optical characteristics
title_fullStr Characterization of cadmium sulfide/titania heterostructure films by utilizing microstructure and optical characteristics
title_full_unstemmed Characterization of cadmium sulfide/titania heterostructure films by utilizing microstructure and optical characteristics
title_sort characterization of cadmium sulfide/titania heterostructure films by utilizing microstructure and optical characteristics
publisher Elsevier Ltd
publishDate 2016
url http://eprints.utm.my/id/eprint/73935/
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84949032734&doi=10.1016%2fj.mssp.2015.10.031&partnerID=40&md5=8991ee67453af5e64774537143173553
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