An accurate operation of wideband multi-port reflectometer with new calibration method implementing least mean square for microwave imaging application
The wideband operation of multi-port reflectometer may lead to inaccurate reflection coefficient measurement caused by the overlapped phase characteristics of the used calibration standards. Therefore, a calibration procedure implementing Least Mean Square (LMS) is proposed to offer accurate operati...
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| Main Authors: | , |
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| Format: | Article |
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Penerbit UTM Press
2015
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| Subjects: | |
| Online Access: | http://eprints.utm.my/id/eprint/57731/ http://dx.doi.org/10.11113/jt.v73.4256 |
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