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Preliminary study of CDTE and CDTE:CU thin films nanostructures deposited by using DC magnetron sputtering

Growth and properties of CdTe and CdTe:Cu thin films nanostrucures deposited by using dc magnetron sputtering are reported. Scanning electron microscope (SEM) was used to observe the surface morphologies of the thin films. At growth conditions of 250 °C and 14 W, CdTe films did not yet evenly deposi...

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Main Authors:	Marwoto, P., Made, D. P. N., Sugianto, Sugianto, Wibowo, E., Othaman, Z., Astuti, S. Y., Aryani, N. P.
Format:	Conference or Workshop Item
Published:	2013
Subjects:	Q Science
Online Access:	http://eprints.utm.my/id/eprint/51255/ http://dx.doi.org/10.1063/1.4820991
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id	my.utm.51255
record_format	eprints
spelling	my.utm.512552017-09-18T00:34:32Z http://eprints.utm.my/id/eprint/51255/ Preliminary study of CDTE and CDTE:CU thin films nanostructures deposited by using DC magnetron sputtering Marwoto, P. Made, D. P. N. Sugianto, Sugianto Wibowo, E. Othaman, Z. Astuti, S. Y. Aryani, N. P. Q Science Growth and properties of CdTe and CdTe:Cu thin films nanostrucures deposited by using dc magnetron sputtering are reported. Scanning electron microscope (SEM) was used to observe the surface morphologies of the thin films. At growth conditions of 250 °C and 14 W, CdTe films did not yet evenly deposited. However, at growth temperature and plasma power of 325 °C and 43 W, both CdTe and CdTe:Cu(2%) have deposited on the substrates. In this condition, the morphology of the films indicate that the films have a grain-like nanostructures. Grain size diameter of about 200 nm begin to appear on top of the films. Energy Dispersive X-rays spectroscopy (EDX) was used to investigate chemical elements of the Cu doped CdTe film deposited. It was found that the film deposited consist of Cd, Te and Cu elements. XRD was used to investigate the full width at half maximum (FWHM) values of the thin films deposited. The results show that CdTe:Cu(2%) thin film has better crystallographic properties than CdTe thin film. The UV-Vis spectrometer was used to investigate the optical properties of thin films deposited. The transmittance spectra showed that transmittance of CdTe:Cu(2%) film is lower than CdTe film. It was found that the bandgap energy of CdTe and CdTe:Cu(2%) thin films of about 1.48 eV. 2013 Conference or Workshop Item PeerReviewed Marwoto, P. and Made, D. P. N. and Sugianto, Sugianto and Wibowo, E. and Othaman, Z. and Astuti, S. Y. and Aryani, N. P. (2013) Preliminary study of CDTE and CDTE:CU thin films nanostructures deposited by using DC magnetron sputtering. In: AIP Conference Proceedings. http://dx.doi.org/10.1063/1.4820991
institution	Universiti Teknologi Malaysia
building	UTM Library
collection	Institutional Repository
continent	Asia
country	Malaysia
content_provider	Universiti Teknologi Malaysia
content_source	UTM Institutional Repository
url_provider	http://eprints.utm.my/
topic	Q Science
spellingShingle	Q Science Marwoto, P. Made, D. P. N. Sugianto, Sugianto Wibowo, E. Othaman, Z. Astuti, S. Y. Aryani, N. P. Preliminary study of CDTE and CDTE:CU thin films nanostructures deposited by using DC magnetron sputtering
description	Growth and properties of CdTe and CdTe:Cu thin films nanostrucures deposited by using dc magnetron sputtering are reported. Scanning electron microscope (SEM) was used to observe the surface morphologies of the thin films. At growth conditions of 250 °C and 14 W, CdTe films did not yet evenly deposited. However, at growth temperature and plasma power of 325 °C and 43 W, both CdTe and CdTe:Cu(2%) have deposited on the substrates. In this condition, the morphology of the films indicate that the films have a grain-like nanostructures. Grain size diameter of about 200 nm begin to appear on top of the films. Energy Dispersive X-rays spectroscopy (EDX) was used to investigate chemical elements of the Cu doped CdTe film deposited. It was found that the film deposited consist of Cd, Te and Cu elements. XRD was used to investigate the full width at half maximum (FWHM) values of the thin films deposited. The results show that CdTe:Cu(2%) thin film has better crystallographic properties than CdTe thin film. The UV-Vis spectrometer was used to investigate the optical properties of thin films deposited. The transmittance spectra showed that transmittance of CdTe:Cu(2%) film is lower than CdTe film. It was found that the bandgap energy of CdTe and CdTe:Cu(2%) thin films of about 1.48 eV.
format	Conference or Workshop Item
author	Marwoto, P. Made, D. P. N. Sugianto, Sugianto Wibowo, E. Othaman, Z. Astuti, S. Y. Aryani, N. P.
author_facet	Marwoto, P. Made, D. P. N. Sugianto, Sugianto Wibowo, E. Othaman, Z. Astuti, S. Y. Aryani, N. P.
author_sort	Marwoto, P.
title	Preliminary study of CDTE and CDTE:CU thin films nanostructures deposited by using DC magnetron sputtering
title_short	Preliminary study of CDTE and CDTE:CU thin films nanostructures deposited by using DC magnetron sputtering
title_full	Preliminary study of CDTE and CDTE:CU thin films nanostructures deposited by using DC magnetron sputtering
title_fullStr	Preliminary study of CDTE and CDTE:CU thin films nanostructures deposited by using DC magnetron sputtering
title_full_unstemmed	Preliminary study of CDTE and CDTE:CU thin films nanostructures deposited by using DC magnetron sputtering
title_sort	preliminary study of cdte and cdte:cu thin films nanostructures deposited by using dc magnetron sputtering
publishDate	2013
url	http://eprints.utm.my/id/eprint/51255/ http://dx.doi.org/10.1063/1.4820991
_version_	1643652985815826432
score	13.211869

Preliminary study of CDTE and CDTE:CU thin films nanostructures deposited by using DC magnetron sputtering

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