Instantaneous and quantitave single cells viability determination using dual nanopobe inside ESEM
We performed single pulses current measurement on single cells using dual nanoprobe through environmental scanning electron microscope nanomanipulator system. The ability to characterize the electrical property of single cells can be used as a novel method for cell viability detection in quantitativ...
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my.utm.471102019-03-31T08:31:51Z http://eprints.utm.my/id/eprint/47110/ Instantaneous and quantitave single cells viability determination using dual nanopobe inside ESEM Ahmad, Mohd. Ridzuan Nakajima, Masahiro Kojima, Masaru Kojima, Seiji Homma, Michio Fukuda, Toshio TA Engineering (General). Civil engineering (General) We performed single pulses current measurement on single cells using dual nanoprobe through environmental scanning electron microscope nanomanipulator system. The ability to characterize the electrical property of single cells can be used as a novel method for cell viability detection in quantitative and instantaneous manners. The nanoprobe was successfully fabricated using focused ion beam tungsten deposition and etching processes. The characteristics of the nanoprobe were examined from the energy dispersion spectrometry and noise analyses. In this paper, for the first time, the electrical property of single cells under their native condition was presented. In order to apply this method for cell viability detection, two types of cells were used, i.e., dead cells and live cells. The results showed that there is a significant difference on the electrical measurement data between dead and live cells. IEEE 2012 Article PeerReviewed Ahmad, Mohd. Ridzuan and Nakajima, Masahiro and Kojima, Masaru and Kojima, Seiji and Homma, Michio and Fukuda, Toshio (2012) Instantaneous and quantitave single cells viability determination using dual nanopobe inside ESEM. IEEE Transactions on Nanotechnology, 11 (2). pp. 298-306. ISSN 1536-125X http://dx.doi.org/10.1109/TNANO.2011.2171989 DOI:10.1109/TNANO.2011.2171989 |
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TA Engineering (General). Civil engineering (General) Ahmad, Mohd. Ridzuan Nakajima, Masahiro Kojima, Masaru Kojima, Seiji Homma, Michio Fukuda, Toshio Instantaneous and quantitave single cells viability determination using dual nanopobe inside ESEM |
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We performed single pulses current measurement on single cells using dual nanoprobe through environmental scanning electron microscope nanomanipulator system. The ability to characterize the electrical property of single cells can be used as a novel method for cell viability detection in quantitative and instantaneous manners. The nanoprobe was successfully fabricated using focused ion beam tungsten deposition and etching processes. The characteristics of the nanoprobe were examined from the energy dispersion spectrometry and noise analyses. In this paper, for the first time, the electrical property of single cells under their native condition was presented. In order to apply this method for cell viability detection, two types of cells were used, i.e., dead cells and live cells. The results showed that there is a significant difference on the electrical measurement data between dead and live cells. |
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Article |
author |
Ahmad, Mohd. Ridzuan Nakajima, Masahiro Kojima, Masaru Kojima, Seiji Homma, Michio Fukuda, Toshio |
author_facet |
Ahmad, Mohd. Ridzuan Nakajima, Masahiro Kojima, Masaru Kojima, Seiji Homma, Michio Fukuda, Toshio |
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Ahmad, Mohd. Ridzuan |
title |
Instantaneous and quantitave single cells viability determination using dual nanopobe inside ESEM |
title_short |
Instantaneous and quantitave single cells viability determination using dual nanopobe inside ESEM |
title_full |
Instantaneous and quantitave single cells viability determination using dual nanopobe inside ESEM |
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Instantaneous and quantitave single cells viability determination using dual nanopobe inside ESEM |
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Instantaneous and quantitave single cells viability determination using dual nanopobe inside ESEM |
title_sort |
instantaneous and quantitave single cells viability determination using dual nanopobe inside esem |
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IEEE |
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2012 |
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http://eprints.utm.my/id/eprint/47110/ http://dx.doi.org/10.1109/TNANO.2011.2171989 |
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