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Design of an intelligent vision inspection system for quality control in semiconductor industry

This is the second project of the Program entitled “Design and Development of an Intelligent Vision Software with Integrated Automated Systems and their Applications”. Unlike the first project of the program (Project Code 74503) the primary objective was to develop a PC-based engine for vision syste...

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Main Author: Mohd. Amin, Shamsudin
Format: Monograph
Language:English
Published: Faculty of Electrical Engineering 2005
Subjects:
TS Manufactures
Online Access:http://eprints.utm.my/id/eprint/4282/1/74504.pdf
http://eprints.utm.my/id/eprint/4282/
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spelling my.utm.42822017-08-07T01:46:44Z http://eprints.utm.my/id/eprint/4282/ Design of an intelligent vision inspection system for quality control in semiconductor industry Mohd. Amin, Shamsudin TS Manufactures This is the second project of the Program entitled “Design and Development of an Intelligent Vision Software with Integrated Automated Systems and their Applications”. Unlike the first project of the program (Project Code 74503) the primary objective was to develop a PC-based engine for vision system development. In this project the focus is towards applying the in-house developed image processing library or better known as VSDP for quality control inspection in the semiconductor industry. Other than applying image processing techniques, feature extraction and artificial intelligence techniques were also applied in this project. This project involves research and data collection in identifying faults of semiconductors; especially in 4 key quality aspects of a semiconductor IC, which are (1) Marking Quality, (2) Lead Quality, (3) Package Quality and (4) Post Die Attach Quality. Faculty of Electrical Engineering 2005-05-31 Monograph NonPeerReviewed application/pdf en http://eprints.utm.my/id/eprint/4282/1/74504.pdf Mohd. Amin, Shamsudin (2005) Design of an intelligent vision inspection system for quality control in semiconductor industry. Project Report. Faculty of Electrical Engineering, Skudai, Johor. (Unpublished)
institution Universiti Teknologi Malaysia
building UTM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Malaysia
content_source UTM Institutional Repository
url_provider http://eprints.utm.my/
language English
topic TS Manufactures
spellingShingle TS Manufactures
Mohd. Amin, Shamsudin
Design of an intelligent vision inspection system for quality control in semiconductor industry
description This is the second project of the Program entitled “Design and Development of an Intelligent Vision Software with Integrated Automated Systems and their Applications”. Unlike the first project of the program (Project Code 74503) the primary objective was to develop a PC-based engine for vision system development. In this project the focus is towards applying the in-house developed image processing library or better known as VSDP for quality control inspection in the semiconductor industry. Other than applying image processing techniques, feature extraction and artificial intelligence techniques were also applied in this project. This project involves research and data collection in identifying faults of semiconductors; especially in 4 key quality aspects of a semiconductor IC, which are (1) Marking Quality, (2) Lead Quality, (3) Package Quality and (4) Post Die Attach Quality.
format Monograph
author Mohd. Amin, Shamsudin
author_facet Mohd. Amin, Shamsudin
author_sort Mohd. Amin, Shamsudin
title Design of an intelligent vision inspection system for quality control in semiconductor industry
title_short Design of an intelligent vision inspection system for quality control in semiconductor industry
title_full Design of an intelligent vision inspection system for quality control in semiconductor industry
title_fullStr Design of an intelligent vision inspection system for quality control in semiconductor industry
title_full_unstemmed Design of an intelligent vision inspection system for quality control in semiconductor industry
title_sort design of an intelligent vision inspection system for quality control in semiconductor industry
publisher Faculty of Electrical Engineering
publishDate 2005
url http://eprints.utm.my/id/eprint/4282/1/74504.pdf
http://eprints.utm.my/id/eprint/4282/
_version_ 1643644013510656000
score 13.211869

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