Iterative diagnosis to improve diagnostic resolution
The area of research is the study of iterative diagnosis. Diagnosis to find faults in semiconductor devices is a well researched field, with most logic diagnosis efforts using the inject-and-evaluate algorithm. However, most diagnosis tools are unable to resolve faults to a single gate/device. Becau...
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| 第一著者: | |
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| フォーマット: | 学位論文 |
| 言語: | English |
| 出版事項: |
2013
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| 主題: | |
| オンライン･アクセス: | http://eprints.utm.my/id/eprint/33800/5/AndrewChuahHooiLeongMFKE2013.pdf http://eprints.utm.my/id/eprint/33800/ |
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