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Iterative diagnosis to improve diagnostic resolution

The area of research is the study of iterative diagnosis. Diagnosis to find faults in semiconductor devices is a well researched field, with most logic diagnosis efforts using the inject-and-evaluate algorithm. However, most diagnosis tools are unable to resolve faults to a single gate/device. Becau...

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Main Author: Chuah, Andrew Hooi Leong
Format: Thesis
Language:English
Published: 2013
Subjects:
TK Electrical engineering. Electronics Nuclear engineering
Online Access:http://eprints.utm.my/id/eprint/33800/5/AndrewChuahHooiLeongMFKE2013.pdf
http://eprints.utm.my/id/eprint/33800/
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spelling my.utm.338002017-09-11T03:07:36Z http://eprints.utm.my/id/eprint/33800/ Iterative diagnosis to improve diagnostic resolution Chuah, Andrew Hooi Leong TK Electrical engineering. Electronics Nuclear engineering The area of research is the study of iterative diagnosis. Diagnosis to find faults in semiconductor devices is a well researched field, with most logic diagnosis efforts using the inject-and-evaluate algorithm. However, most diagnosis tools are unable to resolve faults to a single gate/device. Because of this, fault isolation (FI) engineers are forced to use probing techniques such as IREM logic state imaging (LSI) in order to further isolate the fault to the gate/device level before performing failure analysis. The current method of selecting probe sites is simply to take the list of fault candidates and probe them sequentially or by determining the optimal probe order through manual analysis of the circuit cone. However, in cases where a large list of fault candidates are returned by the diagnosis tool, it is difficult to manually analyze the fault cone as it is too large and complex. This work implements a basic algorithm which allows the diagnosis tool to recommend probe candidates, read in the result of the probe, and continue this cycle iteratively until the fault is fully isolated to a single gate/device. The algorithm is based on a binary search, and shows that a 5-6X reduction in the amount of probing needed can be achieved if the diagnosis tool is used iteratively in the fault isolation flow. 2013-01 Thesis NonPeerReviewed application/pdf en http://eprints.utm.my/id/eprint/33800/5/AndrewChuahHooiLeongMFKE2013.pdf Chuah, Andrew Hooi Leong (2013) Iterative diagnosis to improve diagnostic resolution. Masters thesis, Universiti Teknologi Malaysia, Faculty of Electrical Engineering.
institution Universiti Teknologi Malaysia
building UTM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Malaysia
content_source UTM Institutional Repository
url_provider http://eprints.utm.my/
language English
topic TK Electrical engineering. Electronics Nuclear engineering
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Chuah, Andrew Hooi Leong
Iterative diagnosis to improve diagnostic resolution
description The area of research is the study of iterative diagnosis. Diagnosis to find faults in semiconductor devices is a well researched field, with most logic diagnosis efforts using the inject-and-evaluate algorithm. However, most diagnosis tools are unable to resolve faults to a single gate/device. Because of this, fault isolation (FI) engineers are forced to use probing techniques such as IREM logic state imaging (LSI) in order to further isolate the fault to the gate/device level before performing failure analysis. The current method of selecting probe sites is simply to take the list of fault candidates and probe them sequentially or by determining the optimal probe order through manual analysis of the circuit cone. However, in cases where a large list of fault candidates are returned by the diagnosis tool, it is difficult to manually analyze the fault cone as it is too large and complex. This work implements a basic algorithm which allows the diagnosis tool to recommend probe candidates, read in the result of the probe, and continue this cycle iteratively until the fault is fully isolated to a single gate/device. The algorithm is based on a binary search, and shows that a 5-6X reduction in the amount of probing needed can be achieved if the diagnosis tool is used iteratively in the fault isolation flow.
format Thesis
author Chuah, Andrew Hooi Leong
author_facet Chuah, Andrew Hooi Leong
author_sort Chuah, Andrew Hooi Leong
title Iterative diagnosis to improve diagnostic resolution
title_short Iterative diagnosis to improve diagnostic resolution
title_full Iterative diagnosis to improve diagnostic resolution
title_fullStr Iterative diagnosis to improve diagnostic resolution
title_full_unstemmed Iterative diagnosis to improve diagnostic resolution
title_sort iterative diagnosis to improve diagnostic resolution
publishDate 2013
url http://eprints.utm.my/id/eprint/33800/5/AndrewChuahHooiLeongMFKE2013.pdf
http://eprints.utm.my/id/eprint/33800/
_version_ 1643649434605584384
score 13.211869

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