Development of software system for detecting defective symbols on integrated circuit chip with adjustable readability level
In semiconductor fabrication process, symbol or label inspection is one of the main processes that need to be considered seriously. Errors may occur during the printing process of label or name on the integrated circuit chip (IC). If this occurs, the IC chip may have a wrong name. Providing a reliab...
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| Main Authors: | , , , , , , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2005
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| Subjects: | |
| Online Access: | http://eprints.utm.my/id/eprint/1842/1/aris05_development_of_software_system.pdf http://eprints.utm.my/id/eprint/1842/ |
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