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Evaluation of reduced graphene oxide film using in-plane XRD measurement

This work reports the synthesis of rGO using magnetron sputtering followed by the annealing process in argon. Raman mapping analysis helped confirm the existence of D, G and 2D band after annealing which indicating the formation of rGO and not a monolayer of graphene. Out of plane XRD measurement ob...

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Main Authors: Md. Rudin, Nor Shahira, Omar, Muhammad Firdaus
Format: Conference or Workshop Item
Published: 2022
Subjects:
QC Physics
Online Access:http://eprints.utm.my/103825/
http://dx.doi.org/10.4028/p-wvtrt6
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spelling my.utm.1038252023-11-27T06:30:32Z http://eprints.utm.my/103825/ Evaluation of reduced graphene oxide film using in-plane XRD measurement Md. Rudin, Nor Shahira Omar, Muhammad Firdaus QC Physics This work reports the synthesis of rGO using magnetron sputtering followed by the annealing process in argon. Raman mapping analysis helped confirm the existence of D, G and 2D band after annealing which indicating the formation of rGO and not a monolayer of graphene. Out of plane XRD measurement observed 21.5°, 30.1° and 35.5° corresponding to d-spacing and 0.412 nm, 0.296 nm and 0.253 nm respectively and for in plane XRD measurement are observed at are 2θ peaks at 30.1°, 35.5° and 62.4° corresponding to d-spacing 0.296 nm,0.253 nm and 0.148 nm respectively. All the spectrum shows shifted due to the presence of defect in the deposited rGO structure. Thus, the in plane measurement are successfully demonstrated as an alternative method to evaluate the thin rGO film. 2022 Conference or Workshop Item PeerReviewed Md. Rudin, Nor Shahira and Omar, Muhammad Firdaus (2022) Evaluation of reduced graphene oxide film using in-plane XRD measurement. In: 10th International Conference on X-Rays and Related Techniques in Research and Industry, ICXRI 2021, 18 August 2021 - 19 August 2021, Virtual, Online. http://dx.doi.org/10.4028/p-wvtrt6
institution Universiti Teknologi Malaysia
building UTM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Malaysia
content_source UTM Institutional Repository
url_provider http://eprints.utm.my/
topic QC Physics
spellingShingle QC Physics
Md. Rudin, Nor Shahira
Omar, Muhammad Firdaus
Evaluation of reduced graphene oxide film using in-plane XRD measurement
description This work reports the synthesis of rGO using magnetron sputtering followed by the annealing process in argon. Raman mapping analysis helped confirm the existence of D, G and 2D band after annealing which indicating the formation of rGO and not a monolayer of graphene. Out of plane XRD measurement observed 21.5°, 30.1° and 35.5° corresponding to d-spacing and 0.412 nm, 0.296 nm and 0.253 nm respectively and for in plane XRD measurement are observed at are 2θ peaks at 30.1°, 35.5° and 62.4° corresponding to d-spacing 0.296 nm,0.253 nm and 0.148 nm respectively. All the spectrum shows shifted due to the presence of defect in the deposited rGO structure. Thus, the in plane measurement are successfully demonstrated as an alternative method to evaluate the thin rGO film.
format Conference or Workshop Item
author Md. Rudin, Nor Shahira
Omar, Muhammad Firdaus
author_facet Md. Rudin, Nor Shahira
Omar, Muhammad Firdaus
author_sort Md. Rudin, Nor Shahira
title Evaluation of reduced graphene oxide film using in-plane XRD measurement
title_short Evaluation of reduced graphene oxide film using in-plane XRD measurement
title_full Evaluation of reduced graphene oxide film using in-plane XRD measurement
title_fullStr Evaluation of reduced graphene oxide film using in-plane XRD measurement
title_full_unstemmed Evaluation of reduced graphene oxide film using in-plane XRD measurement
title_sort evaluation of reduced graphene oxide film using in-plane xrd measurement
publishDate 2022
url http://eprints.utm.my/103825/
http://dx.doi.org/10.4028/p-wvtrt6
_version_ 1783876421012160512
score 13.211869

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