Scalable diversified antirandom test pattern generation with improved fault coverage for black-box circuit testing

Pseudorandom testing is incapable of utilizing the success rate of preceding test patterns while generating subsequent test patterns. Many redundant test patterns have been generated that increase the test length without any significant increase in the fault coverage. An extension to pseudorandom te...

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Bibliographic Details
Main Author: Alamgir, Arbab
Format: Thesis
Language:English
Published: 2022
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Online Access:http://eprints.utm.my/id/eprint/101819/1/ArbabAlamgirPSKE2022.pdf
http://eprints.utm.my/id/eprint/101819/
http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:149118
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