Design and fabrication of a novel wideband tem – cell for dielectric measurements

Dielectric properties measurement at microwave frequencies is required to illustrate how the electromagnetic waves propagate through the materials. Various methods have been used for the measurement of dielectric properties including both time and frequency domain methods. The existing systems ar...

詳細記述

保存先:
書誌詳細
第一著者: Yahya Sayegh, Ahmed Mohammed
フォーマット: 学位論文
言語:English
English
出版事項: 2011
主題:
オンライン・アクセス:http://eprints.uthm.edu.my/2588/1/24p%20AHMED%20MOHAMMED%20YAHYA%20SAYEGH.pdf
http://eprints.uthm.edu.my/2588/2/AHMED%20MOHAMMED%20YAHYA%20SAYEGH%20WATERMARK.pdf
http://eprints.uthm.edu.my/2588/
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