Microstructural Analysis of Intermetallic Ni5Al3 Thin Films
The possible magnetic transition phenomenon obtained is postulated particularly on the Nickel Aluminum (Ni5Al3) thin films of different thickness. It was found that the film resistance exhibits a linear but mild increase over the initial temperature range, followed by a transition to a relatively ra...
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Faculty of Mechanical Engineering, UTeM
2010
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my.utem.eprints.64952015-05-28T03:43:04Z http://eprints.utem.edu.my/id/eprint/6495/ Microstructural Analysis of Intermetallic Ni5Al3 Thin Films Joseph Sahaya Anand, T Ngan, A.H.W. TJ Mechanical engineering and machinery The possible magnetic transition phenomenon obtained is postulated particularly on the Nickel Aluminum (Ni5Al3) thin films of different thickness. It was found that the film resistance exhibits a linear but mild increase over the initial temperature range, followed by a transition to a relatively rapid decline in the resistance after attaining maximum at ~170ºC. This positive temperature coefficient of resistance (TCR) makes this material suitable for magneto resistor applications. The same observations were made on two different sputtering systems with different deposition conditions, indicating that the magnetic transition is a highly reproducible phenomenon. Faculty of Mechanical Engineering, UTeM 2010 Article PeerReviewed application/pdf en http://eprints.utem.edu.my/id/eprint/6495/1/JMET_2010.pdf Joseph Sahaya Anand, T and Ngan, A.H.W. (2010) Microstructural Analysis of Intermetallic Ni5Al3 Thin Films. Journal of Mechanical Engineering and Technology, 2 (1). pp. 25-39. ISSN 2180-1053 http://www.utem.edu.my/fkm/ |
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TJ Mechanical engineering and machinery Joseph Sahaya Anand, T Ngan, A.H.W. Microstructural Analysis of Intermetallic Ni5Al3 Thin Films |
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The possible magnetic transition phenomenon obtained is postulated particularly on the Nickel Aluminum (Ni5Al3) thin films of different thickness. It was found that the film resistance exhibits a linear but mild increase over the initial temperature range, followed by a transition to a relatively rapid decline in the resistance after attaining maximum at ~170ºC. This positive temperature coefficient of resistance (TCR) makes this material suitable for magneto resistor applications. The same observations were made on two different sputtering systems with different deposition conditions, indicating that the magnetic transition is a highly reproducible phenomenon. |
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Article |
author |
Joseph Sahaya Anand, T Ngan, A.H.W. |
author_facet |
Joseph Sahaya Anand, T Ngan, A.H.W. |
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Joseph Sahaya Anand, T |
title |
Microstructural Analysis of Intermetallic Ni5Al3 Thin Films |
title_short |
Microstructural Analysis of Intermetallic Ni5Al3 Thin Films |
title_full |
Microstructural Analysis of Intermetallic Ni5Al3 Thin Films |
title_fullStr |
Microstructural Analysis of Intermetallic Ni5Al3 Thin Films |
title_full_unstemmed |
Microstructural Analysis of Intermetallic Ni5Al3 Thin Films |
title_sort |
microstructural analysis of intermetallic ni5al3 thin films |
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Faculty of Mechanical Engineering, UTeM |
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2010 |
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http://eprints.utem.edu.my/id/eprint/6495/1/JMET_2010.pdf http://eprints.utem.edu.my/id/eprint/6495/ http://www.utem.edu.my/fkm/ |
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1665905312833470464 |
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13.211869 |