X-ray and morphological characterization of Al-O thin films used for vertically aligned carbon nanotube growth
Al oxide (Al-O) films used as catalyst-support layer for vertical growth of carbon nanotubes (CNTs) were characterized by means of X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), transmission, and scanning electron microscopies (TEM and SEM). EB-deposited Al films (20 nm) were therm...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Trans Tech Publications
2013
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| Subjects: | |
| Online Access: | http://eprints.utem.edu.my/id/eprint/6433/1/AMR.620.213_%28published%29.pdf http://eprints.utem.edu.my/id/eprint/6433/ |
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