Development Of Variable Sampling Interval Run Sum T Chart And Triple Sampling X ̅ Chart With Estimated Process Parameters
The Shewhart x ̅ control chart is a useful chart in process monitoring. However, the Shewhart x ̅ chart’s performance is significantly affected if the process standard deviation is erroneously estimated. To circumvent this problem, the t chart is commonly used as an alternative to the Shewhart x...
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| 第一著者: | |
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| フォーマット: | 学位論文 |
| 言語: | English |
| 出版事項: |
2022
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| 主題: | |
| オンライン･アクセス: | http://eprints.usm.my/59156/1/24%20Pages%20from%20FAIJUN%20NAHAR%20MIM%20-%20TESIS.pdf http://eprints.usm.my/59156/ |
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| 要約: | The Shewhart x ̅ control chart is a useful chart in process monitoring. However,
the Shewhart x ̅ chart’s performance is significantly affected if the process standard
deviation is erroneously estimated. To circumvent this problem, the t chart is
commonly used as an alternative to the Shewhart x ̅ chart. The first and second
objectives of this thesis aim at enhancing the performance of the basic t chart by
proposing the variable sampling interval run sum (VSI RS) t charts for monitoring the
mean of a process from a normal distribution, based on known and estimated process
mean, respectively. The Markov chain technique is used to compute the optimal
parameters for the new charts. |
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