Modified Statistical Process Control For Short Runs Test And Measurement Process To Reduce False Alarm
The key characteristics of test and measurement (T&M) manufacturing are short production runs, multi-product families and testing at multi-stations. Classical Shewhart control charts, namely x̄ chart and R chart have been widely used in statistical process control (SPC). Short production runs in...
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| Main Author: | |
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| Format: | Thesis |
| Language: | English |
| Published: |
2018
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| Subjects: | |
| Online Access: | http://eprints.usm.my/47816/1/Modified%20Statistical%20Process%20Control%20For%20Short%20Runs%20Test%20And%20Measurement%20Process%20To%20Reduce%20False%20Alarm.pdf http://eprints.usm.my/47816/ |
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