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Development Of Inline Rapid Thermal Transient Test System For Crack Detection Of Alingap On Germanium Carrier

LEDs are the ultimate light source in the lighting technology and growing at double digit percentage for the past few decades. Despite of many virtues in LEDs, there are many challenges it have. One of it is die crack. In this work, the focus is on die-crack on die substrate of an AlInGaP LED at die...

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Main Author: Annaniah, Luruthudass
Format: Thesis
Language:English
Published: 2018
Subjects:
QC1 Physics (General)
Online Access:http://eprints.usm.my/43666/1/LURUTHUDASS%20ANNANIAH.pdf
http://eprints.usm.my/43666/
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spelling my.usm.eprints.43666 http://eprints.usm.my/43666/ Development Of Inline Rapid Thermal Transient Test System For Crack Detection Of Alingap On Germanium Carrier Annaniah, Luruthudass QC1 Physics (General) LEDs are the ultimate light source in the lighting technology and growing at double digit percentage for the past few decades. Despite of many virtues in LEDs, there are many challenges it have. One of it is die crack. In this work, the focus is on die-crack on die substrate of an AlInGaP LED at die attach (DA) process. Here the impact on electro-optical and thermal properties were investigated and a detection method was invented. The cracks were artificially created at Ge substrate using industrial grade DA equipment at bond force range from 40gF to 210gF. Die-crack length were measured using high magnification scope. 2018-02 Thesis NonPeerReviewed application/pdf en http://eprints.usm.my/43666/1/LURUTHUDASS%20ANNANIAH.pdf Annaniah, Luruthudass (2018) Development Of Inline Rapid Thermal Transient Test System For Crack Detection Of Alingap On Germanium Carrier. PhD thesis, Universiti Sains Malaysia.
institution Universiti Sains Malaysia
building Hamzah Sendut Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Sains Malaysia
content_source USM Institutional Repository
url_provider http://eprints.usm.my/
language English
topic QC1 Physics (General)
spellingShingle QC1 Physics (General)
Annaniah, Luruthudass
Development Of Inline Rapid Thermal Transient Test System For Crack Detection Of Alingap On Germanium Carrier
description LEDs are the ultimate light source in the lighting technology and growing at double digit percentage for the past few decades. Despite of many virtues in LEDs, there are many challenges it have. One of it is die crack. In this work, the focus is on die-crack on die substrate of an AlInGaP LED at die attach (DA) process. Here the impact on electro-optical and thermal properties were investigated and a detection method was invented. The cracks were artificially created at Ge substrate using industrial grade DA equipment at bond force range from 40gF to 210gF. Die-crack length were measured using high magnification scope.
format Thesis
author Annaniah, Luruthudass
author_facet Annaniah, Luruthudass
author_sort Annaniah, Luruthudass
title Development Of Inline Rapid Thermal Transient Test System For Crack Detection Of Alingap On Germanium Carrier
title_short Development Of Inline Rapid Thermal Transient Test System For Crack Detection Of Alingap On Germanium Carrier
title_full Development Of Inline Rapid Thermal Transient Test System For Crack Detection Of Alingap On Germanium Carrier
title_fullStr Development Of Inline Rapid Thermal Transient Test System For Crack Detection Of Alingap On Germanium Carrier
title_full_unstemmed Development Of Inline Rapid Thermal Transient Test System For Crack Detection Of Alingap On Germanium Carrier
title_sort development of inline rapid thermal transient test system for crack detection of alingap on germanium carrier
publishDate 2018
url http://eprints.usm.my/43666/1/LURUTHUDASS%20ANNANIAH.pdf
http://eprints.usm.my/43666/
_version_ 1680321831473512448
score 13.211869

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