Cover Image

Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects.

With the increase in signal frequency and the complexity of high-speed interconnects, signal integrity has become a prominent issue in modern electronic devices.

Saved in:
Bibliographic Details
Main Authors: Goh, Patrick, Ain, Mohd Fadzil
Format: Conference or Workshop Item
Language:English
Published: 2014
Subjects:
TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Online Access:http://eprints.usm.my/28202/1/Fast_S-parameter_Convolution_for_Eye_Diagram_Simulations_of_High-speed_Interconnects.pdf
http://eprints.usm.my/28202/
Tags: Add Tag
No Tags, Be the first to tag this record!
id my.usm.eprints.28202
record_format eprints
spelling my.usm.eprints.28202 http://eprints.usm.my/28202/ Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects. Goh, Patrick Ain, Mohd Fadzil TK1-9971 Electrical engineering. Electronics. Nuclear engineering With the increase in signal frequency and the complexity of high-speed interconnects, signal integrity has become a prominent issue in modern electronic devices. 2014 Conference or Workshop Item PeerReviewed application/pdf en http://eprints.usm.my/28202/1/Fast_S-parameter_Convolution_for_Eye_Diagram_Simulations_of_High-speed_Interconnects.pdf Goh, Patrick and Ain, Mohd Fadzil (2014) Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects. In: Seoul International Conference On Applied Science & Engineering 2014, 29 - 31 August 2014, Seoul, Korea Selatan. (Submitted)
institution Universiti Sains Malaysia
building Hamzah Sendut Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Sains Malaysia
content_source USM Institutional Repository
url_provider http://eprints.usm.my/
language English
topic TK1-9971 Electrical engineering. Electronics. Nuclear engineering
spellingShingle TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Goh, Patrick
Ain, Mohd Fadzil
Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects.
description With the increase in signal frequency and the complexity of high-speed interconnects, signal integrity has become a prominent issue in modern electronic devices.
format Conference or Workshop Item
author Goh, Patrick
Ain, Mohd Fadzil
author_facet Goh, Patrick
Ain, Mohd Fadzil
author_sort Goh, Patrick
title Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects.
title_short Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects.
title_full Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects.
title_fullStr Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects.
title_full_unstemmed Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects.
title_sort fast s-parameter convolution for eye diagram simulations of high-speed interconnects.
publishDate 2014
url http://eprints.usm.my/28202/1/Fast_S-parameter_Convolution_for_Eye_Diagram_Simulations_of_High-speed_Interconnects.pdf
http://eprints.usm.my/28202/
_version_ 1643706584153456640
score 13.211869

Similar Items