Software Modification in a Fault Analysis Tool for Critical Path Debugging

Microprocessor units caught with speed failure are becoming more and more eminent as the fabrication process shrinks according to Moore’s Law. Failure Analysis (FA) engineers confront the problem using Critical Path Debug method utilizing special IC (Integrated Circuit) test system capable of tes...

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Bibliographic Details
Main Author: Han, Chung Dean
Format: Thesis
Language:English
English
Published: 2009
Online Access:http://psasir.upm.edu.my/id/eprint/7360/1/FK_2009_50a.pdf
http://psasir.upm.edu.my/id/eprint/7360/
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