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Testing static single cell faults using static and dynamic data background

This work proposes a bit-adjacent Data Background (DB) management scheme to improve fault coverage of March algorithms while simultaneously maintaining the shortest test cycle. Both static and dynamic DB transitions are used in order to detect Deceptive Read Destructive Faults (DRDFs) and Write Dist...

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Main Authors: Zakaria, Nor Azura, Wan Hasan, Wan Zuha, Abdul Halin, Izhal, Mohd Sidek, Roslina, Wen, Xiaoqing
Format: Conference or Workshop Item
Language:English
Published: IEEE 2011
Online Access:http://psasir.upm.edu.my/id/eprint/69132/1/Testing%20static%20single%20cell%20faults%20using%20static%20and%20dynamic%20data%20background.pdf
http://psasir.upm.edu.my/id/eprint/69132/
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spelling my.upm.eprints.691322019-06-12T07:35:19Z http://psasir.upm.edu.my/id/eprint/69132/ Testing static single cell faults using static and dynamic data background Zakaria, Nor Azura Wan Hasan, Wan Zuha Abdul Halin, Izhal Mohd Sidek, Roslina Wen, Xiaoqing This work proposes a bit-adjacent Data Background (DB) management scheme to improve fault coverage of March algorithms while simultaneously maintaining the shortest test cycle. Both static and dynamic DB transitions are used in order to detect Deceptive Read Destructive Faults (DRDFs) and Write Disturb Faults (WDFs) that are not detected by previous algorithms. A conventional March Test Algorithm can be modified by using the DB management scheme to form a new March Test Algorithm (referred to as Mod March Test Algorithm), e.g., MATS++(6N) becoming Mod MATS++(6N). This paper shows that Mod March SR (14N) and Mod March CL (12N) can detect DRDFs and WDFs while the corresponding conventional algorithms cannot. It is also shown that Mod March CL(12N) and Mod March SR(14N) with DB management can detect all Static Single Cell Faults based on the Bit-Oriented-Memories (BOM) test method. Comparisons on test cycle time for Mod March SR, March SR, and March SS in the context of memory Built-In-Self-Test (BIST) are also presented. From the simulation result, it shows that by including Data Backgrounds (DBs) management in Bit-Oriented Memories (BOM), the cycle test time is the same after a given multiple of DBs in the test algorithm. IEEE 2011 Conference or Workshop Item PeerReviewed text en http://psasir.upm.edu.my/id/eprint/69132/1/Testing%20static%20single%20cell%20faults%20using%20static%20and%20dynamic%20data%20background.pdf Zakaria, Nor Azura and Wan Hasan, Wan Zuha and Abdul Halin, Izhal and Mohd Sidek, Roslina and Wen, Xiaoqing (2011) Testing static single cell faults using static and dynamic data background. In: 2011 IEEE Student Conference on Research and Development (SCOReD), 19-20 Dec. 2011, Cyberjaya, Malaysia. (pp. 1-6). 10.1109/SCOReD.2011.6148694
institution Universiti Putra Malaysia
building UPM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Putra Malaysia
content_source UPM Institutional Repository
url_provider http://psasir.upm.edu.my/
language English
description This work proposes a bit-adjacent Data Background (DB) management scheme to improve fault coverage of March algorithms while simultaneously maintaining the shortest test cycle. Both static and dynamic DB transitions are used in order to detect Deceptive Read Destructive Faults (DRDFs) and Write Disturb Faults (WDFs) that are not detected by previous algorithms. A conventional March Test Algorithm can be modified by using the DB management scheme to form a new March Test Algorithm (referred to as Mod March Test Algorithm), e.g., MATS++(6N) becoming Mod MATS++(6N). This paper shows that Mod March SR (14N) and Mod March CL (12N) can detect DRDFs and WDFs while the corresponding conventional algorithms cannot. It is also shown that Mod March CL(12N) and Mod March SR(14N) with DB management can detect all Static Single Cell Faults based on the Bit-Oriented-Memories (BOM) test method. Comparisons on test cycle time for Mod March SR, March SR, and March SS in the context of memory Built-In-Self-Test (BIST) are also presented. From the simulation result, it shows that by including Data Backgrounds (DBs) management in Bit-Oriented Memories (BOM), the cycle test time is the same after a given multiple of DBs in the test algorithm.
format Conference or Workshop Item
author Zakaria, Nor Azura
Wan Hasan, Wan Zuha
Abdul Halin, Izhal
Mohd Sidek, Roslina
Wen, Xiaoqing
spellingShingle Zakaria, Nor Azura
Wan Hasan, Wan Zuha
Abdul Halin, Izhal
Mohd Sidek, Roslina
Wen, Xiaoqing
Testing static single cell faults using static and dynamic data background
author_facet Zakaria, Nor Azura
Wan Hasan, Wan Zuha
Abdul Halin, Izhal
Mohd Sidek, Roslina
Wen, Xiaoqing
author_sort Zakaria, Nor Azura
title Testing static single cell faults using static and dynamic data background
title_short Testing static single cell faults using static and dynamic data background
title_full Testing static single cell faults using static and dynamic data background
title_fullStr Testing static single cell faults using static and dynamic data background
title_full_unstemmed Testing static single cell faults using static and dynamic data background
title_sort testing static single cell faults using static and dynamic data background
publisher IEEE
publishDate 2011
url http://psasir.upm.edu.my/id/eprint/69132/1/Testing%20static%20single%20cell%20faults%20using%20static%20and%20dynamic%20data%20background.pdf
http://psasir.upm.edu.my/id/eprint/69132/
_version_ 1643839406901035008
score 13.211869

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