Comparing instantaneous yield from combine yield monitor against crop cut test estimated yield
Yield map accuracy is an important element for the successful implementation of precision farming practices. Incorrect yield monitor readings cause errors in the yield maps, which lead to inaccurate management decisions. Two methods, namely instantaneous yield from on-board yield monitoring system m...
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| 主要な著者: | , , , |
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| フォーマット: | Conference or Workshop Item |
| 言語: | English |
| 出版事項: |
2015
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| オンライン･アクセス: | http://psasir.upm.edu.my/id/eprint/58246/1/ICSAFEI-173.pdf http://psasir.upm.edu.my/id/eprint/58246/ |
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