An efficient fault syndromes simulator for SRAM memories
Testing and diagnosis techniques play a key role in the advance of semiconductor memory technology. The challenge of failure detection has created intensive investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. At present, March test algorith...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
The Institute of Electronics, Information and Communication Engineers
2009
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| Online Access: | http://psasir.upm.edu.my/id/eprint/13025/1/An%20efficient%20fault%20syndromes%20simulator%20for%20SRAM%20memories.pdf http://psasir.upm.edu.my/id/eprint/13025/ https://www.jstage.jst.go.jp/article/transele/E92.C/5/E92.C_5_639/_article |
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