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Study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy

In this work, we have studied the structural and electrical behavior of Si-incorporated carbon nanostructures (Si-CNS) by performing current-voltage (I-V) measurements using in situ transmission electron microscopy (TEM). The I-V measurement and TEM observation of the corresponding Si-CNS structural...

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Main Authors:	Yaakob, Yazid, Lin, Wei Ming, Rosmi, Mohamad Saufi, Mohd Yusop, Mohd Zamri, Sharma, Subash, Chan, Kar Fei, Asaka, Toru, Tanemura, Masaki
Format:	Article
Published:	Elsevier 2022
Online Access:	http://psasir.upm.edu.my/id/eprint/103341/ https://www.sciencedirect.com/science/article/pii/S2352492822009333
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spelling	my.upm.eprints.1033412023-06-14T03:32:18Z http://psasir.upm.edu.my/id/eprint/103341/ Study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy Yaakob, Yazid Lin, Wei Ming Rosmi, Mohamad Saufi Mohd Yusop, Mohd Zamri Sharma, Subash Chan, Kar Fei Asaka, Toru Tanemura, Masaki In this work, we have studied the structural and electrical behavior of Si-incorporated carbon nanostructures (Si-CNS) by performing current-voltage (I-V) measurements using in situ transmission electron microscopy (TEM). The I-V measurement and TEM observation of the corresponding Si-CNS structural transformation during the process were investigated in detail. Structural transformation of Si-CNS was occurred at high electric current flow (~µA), and reached its peak before electrical breakdown damaging the nanostructures. The formation of few graphene layer from initially amorphous structure were observed with embedded Si particles. The graphitic structures significantly improve the Si-CNS electrical properties depending on the nanostructure shape and Si-C composition. The current increased up to ~24.8 μA for nanofiber, and ~3 mA for nanocone, indicating the improvement of Si-C matrix crystallinity and decrement of Si composition from sublimation due to current-induced Joule heating. In situ heating technique revealed that Si particle begin to agglomerate at ~500 °C and the graphitization on the Si surface occurred at > 700 °C in a low pressure environment (~10−5 Pa). The combination of the in situ TEM study can be promising for further understanding of Si-C structural and electrical behavior towards the future development of next-generation electronic and energy applications. Elsevier 2022 Article PeerReviewed Yaakob, Yazid and Lin, Wei Ming and Rosmi, Mohamad Saufi and Mohd Yusop, Mohd Zamri and Sharma, Subash and Chan, Kar Fei and Asaka, Toru and Tanemura, Masaki (2022) Study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy. Materials Today Communications, 32. art. no. 104081. pp. 1-11. ISSN 2352-4928 https://www.sciencedirect.com/science/article/pii/S2352492822009333 10.1016/j.mtcomm.2022.104081
institution	Universiti Putra Malaysia
building	UPM Library
collection	Institutional Repository
continent	Asia
country	Malaysia
content_provider	Universiti Putra Malaysia
content_source	UPM Institutional Repository
url_provider	http://psasir.upm.edu.my/
description	In this work, we have studied the structural and electrical behavior of Si-incorporated carbon nanostructures (Si-CNS) by performing current-voltage (I-V) measurements using in situ transmission electron microscopy (TEM). The I-V measurement and TEM observation of the corresponding Si-CNS structural transformation during the process were investigated in detail. Structural transformation of Si-CNS was occurred at high electric current flow (~µA), and reached its peak before electrical breakdown damaging the nanostructures. The formation of few graphene layer from initially amorphous structure were observed with embedded Si particles. The graphitic structures significantly improve the Si-CNS electrical properties depending on the nanostructure shape and Si-C composition. The current increased up to ~24.8 μA for nanofiber, and ~3 mA for nanocone, indicating the improvement of Si-C matrix crystallinity and decrement of Si composition from sublimation due to current-induced Joule heating. In situ heating technique revealed that Si particle begin to agglomerate at ~500 °C and the graphitization on the Si surface occurred at > 700 °C in a low pressure environment (~10−5 Pa). The combination of the in situ TEM study can be promising for further understanding of Si-C structural and electrical behavior towards the future development of next-generation electronic and energy applications.
format	Article
author	Yaakob, Yazid Lin, Wei Ming Rosmi, Mohamad Saufi Mohd Yusop, Mohd Zamri Sharma, Subash Chan, Kar Fei Asaka, Toru Tanemura, Masaki
spellingShingle	Yaakob, Yazid Lin, Wei Ming Rosmi, Mohamad Saufi Mohd Yusop, Mohd Zamri Sharma, Subash Chan, Kar Fei Asaka, Toru Tanemura, Masaki Study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy
author_facet	Yaakob, Yazid Lin, Wei Ming Rosmi, Mohamad Saufi Mohd Yusop, Mohd Zamri Sharma, Subash Chan, Kar Fei Asaka, Toru Tanemura, Masaki
author_sort	Yaakob, Yazid
title	Study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy
title_short	Study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy
title_full	Study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy
title_fullStr	Study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy
title_full_unstemmed	Study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy
title_sort	study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy
publisher	Elsevier
publishDate	2022
url	http://psasir.upm.edu.my/id/eprint/103341/ https://www.sciencedirect.com/science/article/pii/S2352492822009333
_version_	1769844451780329472
score	13.211869

Study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy

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