Dielectric verification of FR4 substrate using microstrip bandstop resonator and CAE tool
This paper describes a method to determine the dielectric constant of FR4 substrate material at the operating frequency of 2.3 GHz. The method make used of computer aided engineering (CAE) tool and microstrip bandstop resonator for investigating the dielectric value of a material. In accordance with...
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my.uniten.dspace-307462023-12-29T15:52:22Z Dielectric verification of FR4 substrate using microstrip bandstop resonator and CAE tool Hock G.C. Chakrabarty C.K. Emilliano Badjian M.H. 16021614500 6701755282 35974769600 26967475500 Computer aided engineering Dielectric constant Dispersive Square ring resonator Computer aided engineering Computer crime Digital television Electric network analysis Electric network analyzers Optical resonators Permittivity Bandstop resonators Data sheets Dielectric constants Dielectric values Dispersive Electromagnetic simulators FR4 substrates Measured results Microstripes Operating frequency Simulation result Square ring resonator Straight-forward method Vector network analyzers Wet-etching process Computational methods This paper describes a method to determine the dielectric constant of FR4 substrate material at the operating frequency of 2.3 GHz. The method make used of computer aided engineering (CAE) tool and microstrip bandstop resonator for investigating the dielectric value of a material. In accordance with the data sheet provided by manufacturer which is 4.5 at 10 MHz, a set of preliminary dielectric values are selected in order to explain the proposed technique. Microstrip bandstop resonators with different dimension are designed and analyzed with the electromagnetic simulator. They are fabricated using conventional wet-etching process which is relatively economical compared to other method. After that, the actual responses of the square ring resonators are measured with the vector network analyzer. By matching up the simulation results to the measured results, dielectric values selected earlier are tuned accordingly. The obtained values are used to validate the accuracy of the proposed method. The method is simple to practice. It provides the beginners a fast way and relatively straightforward method in investigating FR4 materials for their research and learning. �2009 IEEE. Final 2023-12-29T07:52:22Z 2023-12-29T07:52:22Z 2009 Conference paper 10.1109/MICC.2009.5431459 2-s2.0-77952180166 https://www.scopus.com/inward/record.uri?eid=2-s2.0-77952180166&doi=10.1109%2fMICC.2009.5431459&partnerID=40&md5=441074874a7cc1d5d11bf839510dd9fc https://irepository.uniten.edu.my/handle/123456789/30746 5431459 894 898 Scopus |
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Computer aided engineering Dielectric constant Dispersive Square ring resonator Computer aided engineering Computer crime Digital television Electric network analysis Electric network analyzers Optical resonators Permittivity Bandstop resonators Data sheets Dielectric constants Dielectric values Dispersive Electromagnetic simulators FR4 substrates Measured results Microstripes Operating frequency Simulation result Square ring resonator Straight-forward method Vector network analyzers Wet-etching process Computational methods |
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Computer aided engineering Dielectric constant Dispersive Square ring resonator Computer aided engineering Computer crime Digital television Electric network analysis Electric network analyzers Optical resonators Permittivity Bandstop resonators Data sheets Dielectric constants Dielectric values Dispersive Electromagnetic simulators FR4 substrates Measured results Microstripes Operating frequency Simulation result Square ring resonator Straight-forward method Vector network analyzers Wet-etching process Computational methods Hock G.C. Chakrabarty C.K. Emilliano Badjian M.H. Dielectric verification of FR4 substrate using microstrip bandstop resonator and CAE tool |
| description |
This paper describes a method to determine the dielectric constant of FR4 substrate material at the operating frequency of 2.3 GHz. The method make used of computer aided engineering (CAE) tool and microstrip bandstop resonator for investigating the dielectric value of a material. In accordance with the data sheet provided by manufacturer which is 4.5 at 10 MHz, a set of preliminary dielectric values are selected in order to explain the proposed technique. Microstrip bandstop resonators with different dimension are designed and analyzed with the electromagnetic simulator. They are fabricated using conventional wet-etching process which is relatively economical compared to other method. After that, the actual responses of the square ring resonators are measured with the vector network analyzer. By matching up the simulation results to the measured results, dielectric values selected earlier are tuned accordingly. The obtained values are used to validate the accuracy of the proposed method. The method is simple to practice. It provides the beginners a fast way and relatively straightforward method in investigating FR4 materials for their research and learning. �2009 IEEE. |
| author2 |
16021614500 |
| author_facet |
16021614500 Hock G.C. Chakrabarty C.K. Emilliano Badjian M.H. |
| format |
Conference paper |
| author |
Hock G.C. Chakrabarty C.K. Emilliano Badjian M.H. |
| author_sort |
Hock G.C. |
| title |
Dielectric verification of FR4 substrate using microstrip bandstop resonator and CAE tool |
| title_short |
Dielectric verification of FR4 substrate using microstrip bandstop resonator and CAE tool |
| title_full |
Dielectric verification of FR4 substrate using microstrip bandstop resonator and CAE tool |
| title_fullStr |
Dielectric verification of FR4 substrate using microstrip bandstop resonator and CAE tool |
| title_full_unstemmed |
Dielectric verification of FR4 substrate using microstrip bandstop resonator and CAE tool |
| title_sort |
dielectric verification of fr4 substrate using microstrip bandstop resonator and cae tool |
| publishDate |
2023 |
| _version_ |
1806425760528859136 |
| score |
13.222552 |