Staff View: Space-Charge-Limited Dark Injection (SCL DI) transient measurements

Space-Charge-Limited Dark Injection (SCL DI) transient measurements

It is not an easy task to probe the mobility of nanoscale thin layers without using expensive and sophisticated equipments such as Time-of-flight photocurrent charge carrier mobility measurement. We present here a powerful yet cost-effective technique, namely the Space-Charge-Limited Dark Injection...

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Main Authors:	Yap B.K., Koh S.P., Tiong S.K., Ong C.N.
Other Authors:	26649255900
Format:	Conference paper
Published:	2023
Subjects:	Semiconductor materials Transient analysis Bulk materials Charge-carrier mobility Dark injection Injection efficiency Mobility value Nano scale Space-charge-limited Thin layers Time-of-flight photocurrents Transient measurement Carrier mobility
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id	my.uniten.dspace-30684
record_format	dspace
spelling	my.uniten.dspace-306842023-12-29T15:51:19Z Space-Charge-Limited Dark Injection (SCL DI) transient measurements Yap B.K. Koh S.P. Tiong S.K. Ong C.N. 26649255900 22951210700 15128307800 36570734800 Semiconductor materials Transient analysis Bulk materials Charge-carrier mobility Dark injection Injection efficiency Mobility value Nano scale Space-charge-limited Thin layers Time-of-flight photocurrents Transient measurement Carrier mobility It is not an easy task to probe the mobility of nanoscale thin layers without using expensive and sophisticated equipments such as Time-of-flight photocurrent charge carrier mobility measurement. We present here a powerful yet cost-effective technique, namely the Space-Charge-Limited Dark Injection (SCL DI) Transient Measurement that allows us to confirm an ohmic injecting interface, to determine the mobility values of the bulk materials and to study the injection efficiency of the interfaces of the semiconductor materials. � 2010 IEEE. Final 2023-12-29T07:51:19Z 2023-12-29T07:51:19Z 2010 Conference paper 10.1109/SMELEC.2010.5549542 2-s2.0-77957576466 https://www.scopus.com/inward/record.uri?eid=2-s2.0-77957576466&doi=10.1109%2fSMELEC.2010.5549542&partnerID=40&md5=75f8cc803081b3b4134b5aa0347725db https://irepository.uniten.edu.my/handle/123456789/30684 5549542 192 194 Scopus
institution	Universiti Tenaga Nasional
building	UNITEN Library
collection	Institutional Repository
continent	Asia
country	Malaysia
content_provider	Universiti Tenaga Nasional
content_source	UNITEN Institutional Repository
url_provider	http://dspace.uniten.edu.my/
topic	Semiconductor materials Transient analysis Bulk materials Charge-carrier mobility Dark injection Injection efficiency Mobility value Nano scale Space-charge-limited Thin layers Time-of-flight photocurrents Transient measurement Carrier mobility
spellingShingle	Semiconductor materials Transient analysis Bulk materials Charge-carrier mobility Dark injection Injection efficiency Mobility value Nano scale Space-charge-limited Thin layers Time-of-flight photocurrents Transient measurement Carrier mobility Yap B.K. Koh S.P. Tiong S.K. Ong C.N. Space-Charge-Limited Dark Injection (SCL DI) transient measurements
description	It is not an easy task to probe the mobility of nanoscale thin layers without using expensive and sophisticated equipments such as Time-of-flight photocurrent charge carrier mobility measurement. We present here a powerful yet cost-effective technique, namely the Space-Charge-Limited Dark Injection (SCL DI) Transient Measurement that allows us to confirm an ohmic injecting interface, to determine the mobility values of the bulk materials and to study the injection efficiency of the interfaces of the semiconductor materials. � 2010 IEEE.
author2	26649255900
author_facet	26649255900 Yap B.K. Koh S.P. Tiong S.K. Ong C.N.
format	Conference paper
author	Yap B.K. Koh S.P. Tiong S.K. Ong C.N.
author_sort	Yap B.K.
title	Space-Charge-Limited Dark Injection (SCL DI) transient measurements
title_short	Space-Charge-Limited Dark Injection (SCL DI) transient measurements
title_full	Space-Charge-Limited Dark Injection (SCL DI) transient measurements
title_fullStr	Space-Charge-Limited Dark Injection (SCL DI) transient measurements
title_full_unstemmed	Space-Charge-Limited Dark Injection (SCL DI) transient measurements
title_sort	space-charge-limited dark injection (scl di) transient measurements
publishDate	2023
_version_	1806425777747525632
score	13.222552

Space-Charge-Limited Dark Injection (SCL DI) transient measurements

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