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Electrical stability of PLEDs

We report the impact of inserting a 10 nm thickness interlayer between the poly(3,4-ethylenedioxythiophene):poly(styrenesulphonate) (PEDOT:PSS) and light-emitting layers on degradation, in particular the electrical stability of the injecting electrodes, in encapsulated polymer light emitting diodes...

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Main Authors:	Kar Y.B., Bradley D.
Other Authors:	26649255900
Format:	Conference paper
Published:	2023
Subjects:	Aromatic compounds Light emission Light emitting diodes Nanotechnology Organic polymers Dark injection Dibenzothiophenes Electrical stability Electrical stress testing Ethylenedioxythiophenes Lifetime data Light emitting layers PEDOT:PSS Phenylenediamines Polymer light-emitting diodes Sumitomo chemicals Time evolutions Power quality
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id	my.uniten.dspace-30591
record_format	dspace
spelling	my.uniten.dspace-305912023-12-29T15:49:56Z Electrical stability of PLEDs Kar Y.B. Bradley D. 26649255900 55661006300 Aromatic compounds Light emission Light emitting diodes Nanotechnology Organic polymers Dark injection Dibenzothiophenes Electrical stability Electrical stress testing Ethylenedioxythiophenes Lifetime data Light emitting layers PEDOT:PSS Phenylenediamines Polymer light-emitting diodes Sumitomo chemicals Time evolutions Power quality We report the impact of inserting a 10 nm thickness interlayer between the poly(3,4-ethylenedioxythiophene):poly(styrenesulphonate) (PEDOT:PSS) and light-emitting layers on degradation, in particular the electrical stability of the injecting electrodes, in encapsulated polymer light emitting diodes (PLEDs). Continuous electrical stress testing is carried out to study the time evolution of dark injection hole transients for devices with and without a poly [2,7-(9,9-di-n-octylfluorene)-alt-(1,4-phenylene-((4-secbutylphenyl)imino)-1, 4-phenylene)] (TFB) interlayer. A Sumitomo Chemical Company dibenzothiophene phenylenediamine copolymer (SC002) was used as light emitting layer and PLED characteristics with and without the interlayer are discussed together with lifetime data. �2010 IEEE. Final 2023-12-29T07:49:56Z 2023-12-29T07:49:56Z 2010 Conference paper 10.1109/ESCINANO.2010.5700945 2-s2.0-79951780891 https://www.scopus.com/inward/record.uri?eid=2-s2.0-79951780891&doi=10.1109%2fESCINANO.2010.5700945&partnerID=40&md5=0b160d8e3126d5ee02a5ede945708af3 https://irepository.uniten.edu.my/handle/123456789/30591 5700945 Scopus
institution	Universiti Tenaga Nasional
building	UNITEN Library
collection	Institutional Repository
continent	Asia
country	Malaysia
content_provider	Universiti Tenaga Nasional
content_source	UNITEN Institutional Repository
url_provider	http://dspace.uniten.edu.my/
topic	Aromatic compounds Light emission Light emitting diodes Nanotechnology Organic polymers Dark injection Dibenzothiophenes Electrical stability Electrical stress testing Ethylenedioxythiophenes Lifetime data Light emitting layers PEDOT:PSS Phenylenediamines Polymer light-emitting diodes Sumitomo chemicals Time evolutions Power quality
spellingShingle	Aromatic compounds Light emission Light emitting diodes Nanotechnology Organic polymers Dark injection Dibenzothiophenes Electrical stability Electrical stress testing Ethylenedioxythiophenes Lifetime data Light emitting layers PEDOT:PSS Phenylenediamines Polymer light-emitting diodes Sumitomo chemicals Time evolutions Power quality Kar Y.B. Bradley D. Electrical stability of PLEDs
description	We report the impact of inserting a 10 nm thickness interlayer between the poly(3,4-ethylenedioxythiophene):poly(styrenesulphonate) (PEDOT:PSS) and light-emitting layers on degradation, in particular the electrical stability of the injecting electrodes, in encapsulated polymer light emitting diodes (PLEDs). Continuous electrical stress testing is carried out to study the time evolution of dark injection hole transients for devices with and without a poly [2,7-(9,9-di-n-octylfluorene)-alt-(1,4-phenylene-((4-secbutylphenyl)imino)-1, 4-phenylene)] (TFB) interlayer. A Sumitomo Chemical Company dibenzothiophene phenylenediamine copolymer (SC002) was used as light emitting layer and PLED characteristics with and without the interlayer are discussed together with lifetime data. �2010 IEEE.
author2	26649255900
author_facet	26649255900 Kar Y.B. Bradley D.
format	Conference paper
author	Kar Y.B. Bradley D.
author_sort	Kar Y.B.
title	Electrical stability of PLEDs
title_short	Electrical stability of PLEDs
title_full	Electrical stability of PLEDs
title_fullStr	Electrical stability of PLEDs
title_full_unstemmed	Electrical stability of PLEDs
title_sort	electrical stability of pleds
publishDate	2023
_version_	1806425598204051456
score	13.222552

Electrical stability of PLEDs

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