Process optimization approach in fine pitch Cu wire bonding

With SiO2 dielectric under aluminum pads, a 60 m bond pad pitch with 52 um bond pad opening Cu wire bonding process was developed in PBGA Hip 7 PGE wafer technology. The critical factors (wire type, capillary, and bonding parameter) and critical responses (bonded ball diameter, bonded ball height, w...

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主要な著者: Wong B.K., Yong C.C., Eu P.L., Yap B.K.
その他の著者: 36992192300
フォーマット: Conference paper
出版事項: 2023
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