Investigation of Morphological, Optical, and Dielectric Properties of RF Sputtered WOx Thin Films for Optoelectronic Applications
Tungsten oxide (WOx) thin films were synthesized through the RF magnetron sputtering method by varying the sputtering power from 30 W to 80 W. Different investigations have been conducted to evaluate the variation in different morphological, optical, and dielectric properties with the sputtering pow...
Saved in:
Main Authors: | , , , , , , , , , , , , , |
---|---|
其他作者: | |
格式: | Article |
出版: |
MDPI
2023
|
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|