Optimization of process parameters for threshold voltage and leakage current based on taguchi method

In this study, the effect of process parameters on the threshold voltage (Vth) and leakage current (Ileak) were explored and the optimization of these parameters were carried out using the Taguchi method. The virtual device was initially constructed using ATHENA and ATLAS environment in Silvaco Tech...

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Main Authors: Noor Faizah Z.A., Ahmad I., Ker P.J., Menon P.S., Afifah Maheran A.H., Mah S.K.
Other Authors: 56395444600
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Published: Universiti Teknikal Malaysia Melaka 2023
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spelling my.uniten.dspace-241832023-05-29T14:56:32Z Optimization of process parameters for threshold voltage and leakage current based on taguchi method Noor Faizah Z.A. Ahmad I. Ker P.J. Menon P.S. Afifah Maheran A.H. Mah S.K. 56395444600 12792216600 37461740800 57201289731 36570222300 57191706660 In this study, the effect of process parameters on the threshold voltage (Vth) and leakage current (Ileak) were explored and the optimization of these parameters were carried out using the Taguchi method. The virtual device was initially constructed using ATHENA and ATLAS environment in Silvaco Technology Computer Aided Design (TCAD) tools. The simulation studies were directed under four varying process parameters, which are Vt adjust implantation dose, the halo tiling angle, the S/D implantation dose and the compensation implantation dose. The L9 Orthogonal Array (OA), the signal-to-noise ratio (SNR), and the analysis of variance (ANOVA) were used to study the performance characteristics and to gain an optimum combination of parameter settings. It was revealed that the Vt adjust implantation dose was the most influential parameter on the Vth and Ileak. Furthermore, it also improves the device performance. The result of Vth complied with the projections made by the International Technology Roadmap for Semiconductors (ITRS). � 2018 Universiti Teknikal Malaysia Melaka. All Rights Reserved. Final 2023-05-29T06:56:32Z 2023-05-29T06:56:32Z 2018 Article 2-s2.0-85052023014 https://www.scopus.com/inward/record.uri?eid=2-s2.0-85052023014&partnerID=40&md5=44c4c5e695e2e5d29f97d54ee5b42e6b https://irepository.uniten.edu.my/handle/123456789/24183 10 2-Jul 143 146 Universiti Teknikal Malaysia Melaka Scopus
institution Universiti Tenaga Nasional
building UNITEN Library
collection Institutional Repository
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country Malaysia
content_provider Universiti Tenaga Nasional
content_source UNITEN Institutional Repository
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description In this study, the effect of process parameters on the threshold voltage (Vth) and leakage current (Ileak) were explored and the optimization of these parameters were carried out using the Taguchi method. The virtual device was initially constructed using ATHENA and ATLAS environment in Silvaco Technology Computer Aided Design (TCAD) tools. The simulation studies were directed under four varying process parameters, which are Vt adjust implantation dose, the halo tiling angle, the S/D implantation dose and the compensation implantation dose. The L9 Orthogonal Array (OA), the signal-to-noise ratio (SNR), and the analysis of variance (ANOVA) were used to study the performance characteristics and to gain an optimum combination of parameter settings. It was revealed that the Vt adjust implantation dose was the most influential parameter on the Vth and Ileak. Furthermore, it also improves the device performance. The result of Vth complied with the projections made by the International Technology Roadmap for Semiconductors (ITRS). � 2018 Universiti Teknikal Malaysia Melaka. All Rights Reserved.
author2 56395444600
author_facet 56395444600
Noor Faizah Z.A.
Ahmad I.
Ker P.J.
Menon P.S.
Afifah Maheran A.H.
Mah S.K.
format Article
author Noor Faizah Z.A.
Ahmad I.
Ker P.J.
Menon P.S.
Afifah Maheran A.H.
Mah S.K.
spellingShingle Noor Faizah Z.A.
Ahmad I.
Ker P.J.
Menon P.S.
Afifah Maheran A.H.
Mah S.K.
Optimization of process parameters for threshold voltage and leakage current based on taguchi method
author_sort Noor Faizah Z.A.
title Optimization of process parameters for threshold voltage and leakage current based on taguchi method
title_short Optimization of process parameters for threshold voltage and leakage current based on taguchi method
title_full Optimization of process parameters for threshold voltage and leakage current based on taguchi method
title_fullStr Optimization of process parameters for threshold voltage and leakage current based on taguchi method
title_full_unstemmed Optimization of process parameters for threshold voltage and leakage current based on taguchi method
title_sort optimization of process parameters for threshold voltage and leakage current based on taguchi method
publisher Universiti Teknikal Malaysia Melaka
publishDate 2023
_version_ 1806424368983572480
score 13.222552