Soft Error Analysis On Digital Circuit
Soft errors, also known as Single Event Upsets (SEUs), occur due to the impact of energetic particles originating from sources such as cosmic rays, radioactive decay, or particle strikes. These incidents result in radiation strikes that can disrupt the charge in a memory cell, flip-flop, or regis...
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| Format: | Final Year Project Report |
| Language: | English English |
| Published: |
Universiti Malaysia Sarawak (UNIMAS)
2023
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| Online Access: | http://ir.unimas.my/id/eprint/43020/1/Nur%20Faiqah%20%2824pgs%29.pdf http://ir.unimas.my/id/eprint/43020/2/Nur%20Faiqah%20%28Fulltext%29.pdf http://ir.unimas.my/id/eprint/43020/ |
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