Description: CMOS standby leakage current problems in microcontroller device

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Bibliographic Details
Main Authors:	Hazian, Mamat, Zaliman, Sauli
Other Authors:	hazian@mimos.my
Format:	Working Paper
Language:	English
Published:	Institute of Electrical and Electronics Engineering (IEEE) 2009
Subjects:	CMOS logic circuits Dielectric thin films Integrated circuit yield Leakage currents Microcontrollers Resists CMOS logic processing
Online Access:	http://dspace.unimap.edu.my/xmlui/handle/123456789/7404
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