Algorithm to improve process robustness in the assembly & test manufacturing industry a case study of the 1064nm wavelength laser mark equipment

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Bibliographic Details
Main Authors: Darin Moreira A/L Anthony Vincent, Bhuvenesh, Prof. Dr. Rajamony
Other Authors: bhuvenesh@unimap.edu.my
Format: Article
Language:English
Published: Trans Tech Publications 2013
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Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/28650
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