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Morphological, structural and electrical properties of pentacene thin films grown via thermal evaporation technique

The physical and structural characteristics of pentacene thin films on indium tin oxide (ITO)-coated glass were studied. The pentacene films were deposited using the thermal evaporation method with deposition times of 20, 30, and 60 minutes. Field-emission scanning electron microscopy (FESEM) images...

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Main Authors: Fatin Nor Ahmad, Yusmar Palapa Wijaya, Khairul Anuar Mohamad, Nafarizal Nayan, Megat Muhammad Ikhsan Megat Hasnan, Afishah Alias, Bablu Kumar Ghosh
Format: Article
Language:English
English
Published: Institute of Advanced Engineering and Science (IAES) 2021
Subjects:
QC669-675.8 Electromagnetic theory
TK7800-8360 Electronics
Online Access:https://eprints.ums.edu.my/id/eprint/30901/1/Morphological%2C%20structural%20and%20electrical%20properties%20of%20pentacene%20thin%20films%20grown%20via%20thermal%20evaporation%20technique-ABSTRACT.pdf
https://eprints.ums.edu.my/id/eprint/30901/2/Morphological%2C%20structural%20and%20electrical%20properties%20of%20pentacene%20thin%20films%20grown%20via%20thermal%20evaporation%20technique.pdf
https://eprints.ums.edu.my/id/eprint/30901/
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http://doi.org/10.11591/eei.v10i3.3029
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spelling my.ums.eprints.309012021-10-29T05:38:35Z https://eprints.ums.edu.my/id/eprint/30901/ Morphological, structural and electrical properties of pentacene thin films grown via thermal evaporation technique Fatin Nor Ahmad Yusmar Palapa Wijaya Khairul Anuar Mohamad Nafarizal Nayan Megat Muhammad Ikhsan Megat Hasnan Afishah Alias Bablu Kumar Ghosh QC669-675.8 Electromagnetic theory TK7800-8360 Electronics The physical and structural characteristics of pentacene thin films on indium tin oxide (ITO)-coated glass were studied. The pentacene films were deposited using the thermal evaporation method with deposition times of 20, 30, and 60 minutes. Field-emission scanning electron microscopy (FESEM) images revealed that film thickness increased with deposition time, with a bulk phase layer appearing at 60 minutes. The presence of the thin-film phase corresponding to 15.5 Å lattice spacing was demonstrated by X-ray diffraction (XRD) patterns in pentacene films with deposition times of 20 and 30 minutes. Meanwhile, with a deposition time of 60 minutes and a lattice spacing of 14.5 Å, the existence of the bulk phase was verified in the pentacene film. Atomic force microscopy (AFM) images of the crystallinity of the pentacene films revealed that the pentacene films deposited on ITO-coated glass exhibited the formation of similar islands with modular grains, results in a fine crystalline structure. From the current-voltage (I-V) and current density-voltage (J-V) characteristics, the pentacene films were ohmic and that current increased as the pentacene’s thickness decreased. Pentacene films deposited on an ITO-coated glass substrate showed potential in the development of broadband and narrowband optoelectronic devices on a transparent substrate. Institute of Advanced Engineering and Science (IAES) 2021-06 Article PeerReviewed text en https://eprints.ums.edu.my/id/eprint/30901/1/Morphological%2C%20structural%20and%20electrical%20properties%20of%20pentacene%20thin%20films%20grown%20via%20thermal%20evaporation%20technique-ABSTRACT.pdf text en https://eprints.ums.edu.my/id/eprint/30901/2/Morphological%2C%20structural%20and%20electrical%20properties%20of%20pentacene%20thin%20films%20grown%20via%20thermal%20evaporation%20technique.pdf Fatin Nor Ahmad and Yusmar Palapa Wijaya and Khairul Anuar Mohamad and Nafarizal Nayan and Megat Muhammad Ikhsan Megat Hasnan and Afishah Alias and Bablu Kumar Ghosh (2021) Morphological, structural and electrical properties of pentacene thin films grown via thermal evaporation technique. Bulletin of Electrical Engineering and Informatics, 10 (3). pp. 1291-1299. ISSN 2089-3191 (P-ISSN) , 2302-9285 ( E-ISSN) https://www.scopus.com/inward/record.uri?eid=2-s2.0-85108060128&doi=10.11591%2feei.v10i3.3029&partnerID=40&md5=90bb1c48445f915b469807c4ae2d8808 http://doi.org/10.11591/eei.v10i3.3029
institution Universiti Malaysia Sabah
building UMS Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Sabah
content_source UMS Institutional Repository
url_provider http://eprints.ums.edu.my/
language English
English
topic QC669-675.8 Electromagnetic theory
TK7800-8360 Electronics
spellingShingle QC669-675.8 Electromagnetic theory
TK7800-8360 Electronics
Fatin Nor Ahmad
Yusmar Palapa Wijaya
Khairul Anuar Mohamad
Nafarizal Nayan
Megat Muhammad Ikhsan Megat Hasnan
Afishah Alias
Bablu Kumar Ghosh
Morphological, structural and electrical properties of pentacene thin films grown via thermal evaporation technique
description The physical and structural characteristics of pentacene thin films on indium tin oxide (ITO)-coated glass were studied. The pentacene films were deposited using the thermal evaporation method with deposition times of 20, 30, and 60 minutes. Field-emission scanning electron microscopy (FESEM) images revealed that film thickness increased with deposition time, with a bulk phase layer appearing at 60 minutes. The presence of the thin-film phase corresponding to 15.5 Å lattice spacing was demonstrated by X-ray diffraction (XRD) patterns in pentacene films with deposition times of 20 and 30 minutes. Meanwhile, with a deposition time of 60 minutes and a lattice spacing of 14.5 Å, the existence of the bulk phase was verified in the pentacene film. Atomic force microscopy (AFM) images of the crystallinity of the pentacene films revealed that the pentacene films deposited on ITO-coated glass exhibited the formation of similar islands with modular grains, results in a fine crystalline structure. From the current-voltage (I-V) and current density-voltage (J-V) characteristics, the pentacene films were ohmic and that current increased as the pentacene’s thickness decreased. Pentacene films deposited on an ITO-coated glass substrate showed potential in the development of broadband and narrowband optoelectronic devices on a transparent substrate.
format Article
author Fatin Nor Ahmad
Yusmar Palapa Wijaya
Khairul Anuar Mohamad
Nafarizal Nayan
Megat Muhammad Ikhsan Megat Hasnan
Afishah Alias
Bablu Kumar Ghosh
author_facet Fatin Nor Ahmad
Yusmar Palapa Wijaya
Khairul Anuar Mohamad
Nafarizal Nayan
Megat Muhammad Ikhsan Megat Hasnan
Afishah Alias
Bablu Kumar Ghosh
author_sort Fatin Nor Ahmad
title Morphological, structural and electrical properties of pentacene thin films grown via thermal evaporation technique
title_short Morphological, structural and electrical properties of pentacene thin films grown via thermal evaporation technique
title_full Morphological, structural and electrical properties of pentacene thin films grown via thermal evaporation technique
title_fullStr Morphological, structural and electrical properties of pentacene thin films grown via thermal evaporation technique
title_full_unstemmed Morphological, structural and electrical properties of pentacene thin films grown via thermal evaporation technique
title_sort morphological, structural and electrical properties of pentacene thin films grown via thermal evaporation technique
publisher Institute of Advanced Engineering and Science (IAES)
publishDate 2021
url https://eprints.ums.edu.my/id/eprint/30901/1/Morphological%2C%20structural%20and%20electrical%20properties%20of%20pentacene%20thin%20films%20grown%20via%20thermal%20evaporation%20technique-ABSTRACT.pdf
https://eprints.ums.edu.my/id/eprint/30901/2/Morphological%2C%20structural%20and%20electrical%20properties%20of%20pentacene%20thin%20films%20grown%20via%20thermal%20evaporation%20technique.pdf
https://eprints.ums.edu.my/id/eprint/30901/
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85108060128&doi=10.11591%2feei.v10i3.3029&partnerID=40&md5=90bb1c48445f915b469807c4ae2d8808
http://doi.org/10.11591/eei.v10i3.3029
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score 13.211869

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