Degradation analysis based on design considerations of advanced-process MOSFET / Ainul Fatin Muhammad Alimin
The unceasing scaling of complementary metal-oxide-semiconductor (CMOS) technology has contributed to the steady increase in transistors performance for the past decades. However, it will also increase the power densities which will eventually leads to the increase in temperatures and other scaling...
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis |
| Published: |
2018
|
| Subjects: | |
| Online Access: | http://studentsrepo.um.edu.my/9116/1/Ainul_Fatin_Muhammad_Alimin.bmp http://studentsrepo.um.edu.my/9116/11/ainul.pdf http://studentsrepo.um.edu.my/9116/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
