Development of techniques for in-situ monitoring stress-induced degradation and potential solutions for FPGA / Anuar Jaafar
Reliability and application failures occurring in Field Programmable Gate Arrays (FPGAs) are pressing issues in today’s specific FPGA application. This is due to the high density of logic circuits on the chip subsequent to rapid process technology scaling. Reliability issues in FPGA lead to the degr...
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| Format: | Thesis |
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2022
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| Online Access: | http://studentsrepo.um.edu.my/14348/2/Anuar.pdf http://studentsrepo.um.edu.my/14348/1/Anuar.pdf http://studentsrepo.um.edu.my/14348/ |
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