Design and analysis of soft error rate in FET/CNTFET based radiation hardened SRAM cell
Aerospace equipages encounter potential radiation footprints through which soft errors occur in the memories onboard. Hence, robustness against radiation with reliability in memory cells is a crucial factor in aerospace electronic systems. This work proposes a novel Carbon nanotube field-effect tran...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Published: |
MDPI
2022
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| Subjects: | |
| Online Access: | http://eprints.um.edu.my/33576/ |
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