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Bulk substrate porosity verification by applying Monte Carlo modeling and Castaing’s formula using energy-dispersive x-rays

The leadframe fabrication process normally involves additional thin-metal layer plating on the bulk copper substrate surface for wire bonding purposes. Silver, tin, and copper flakes are commonly adopted as plating materials. It is critical to assess the density of the plated metal layer, and in par...

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Main Authors: Yung, L.C., Fei, C.C., Mandeep, J.S., Amin, N., Lai, K.W.
Format: Article
Published: International Society for Optical Engineering (SPIE) 2015
Subjects:
TA Engineering (General). Civil engineering (General)
Online Access:http://eprints.um.edu.my/19334/
http://dx.doi.org/10.1117/1.JEI.24.6.061105
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spelling my.um.eprints.193342018-09-20T06:17:15Z http://eprints.um.edu.my/19334/ Bulk substrate porosity verification by applying Monte Carlo modeling and Castaing’s formula using energy-dispersive x-rays Yung, L.C. Fei, C.C. Mandeep, J.S. Amin, N. Lai, K.W. TA Engineering (General). Civil engineering (General) The leadframe fabrication process normally involves additional thin-metal layer plating on the bulk copper substrate surface for wire bonding purposes. Silver, tin, and copper flakes are commonly adopted as plating materials. It is critical to assess the density of the plated metal layer, and in particular to look for porosity or voids underneath the layer, which may reduce the reliability during high-temperature stress. A fast, reliable inspection technique is needed to assess the porosity or void weakness. To this end, the characteristics of x-rays generated from bulk samples were examined using an energy-dispersive x-ray (EDX) detector to examine the porosity percentage. Monte Carlo modeling was integrated with Castaing's formula to verify the integrity of the experimental data. Samples with different porosity percentages were considered to test the correlation between the intensity of the collected x-ray signal and the material density. To further verify the integrity of the model, conventional cross-sectional samples were also taken to observe the porosity percentage using Image J software measurement. A breakthrough in bulk substrate assessment was achieved by applying EDX for the first time to nonelemental analysis. The experimental data showed that the EDX features were not only useful for elemental analysis, but also applicable to thin-film metal layer thickness measurement and bulk material density determination. A detailed experiment was conducted using EDX to assess the plating metal layer and bulk material porosity. International Society for Optical Engineering (SPIE) 2015 Article PeerReviewed Yung, L.C. and Fei, C.C. and Mandeep, J.S. and Amin, N. and Lai, K.W. (2015) Bulk substrate porosity verification by applying Monte Carlo modeling and Castaing’s formula using energy-dispersive x-rays. The Journal of Electronic Imaging (JEI), 24 (6). 061105. ISSN 1017-9909 http://dx.doi.org/10.1117/1.JEI.24.6.061105 doi:10.1117/1.JEI.24.6.061105
institution Universiti Malaya
building UM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaya
content_source UM Research Repository
url_provider http://eprints.um.edu.my/
topic TA Engineering (General). Civil engineering (General)
spellingShingle TA Engineering (General). Civil engineering (General)
Yung, L.C.
Fei, C.C.
Mandeep, J.S.
Amin, N.
Lai, K.W.
Bulk substrate porosity verification by applying Monte Carlo modeling and Castaing’s formula using energy-dispersive x-rays
description The leadframe fabrication process normally involves additional thin-metal layer plating on the bulk copper substrate surface for wire bonding purposes. Silver, tin, and copper flakes are commonly adopted as plating materials. It is critical to assess the density of the plated metal layer, and in particular to look for porosity or voids underneath the layer, which may reduce the reliability during high-temperature stress. A fast, reliable inspection technique is needed to assess the porosity or void weakness. To this end, the characteristics of x-rays generated from bulk samples were examined using an energy-dispersive x-ray (EDX) detector to examine the porosity percentage. Monte Carlo modeling was integrated with Castaing's formula to verify the integrity of the experimental data. Samples with different porosity percentages were considered to test the correlation between the intensity of the collected x-ray signal and the material density. To further verify the integrity of the model, conventional cross-sectional samples were also taken to observe the porosity percentage using Image J software measurement. A breakthrough in bulk substrate assessment was achieved by applying EDX for the first time to nonelemental analysis. The experimental data showed that the EDX features were not only useful for elemental analysis, but also applicable to thin-film metal layer thickness measurement and bulk material density determination. A detailed experiment was conducted using EDX to assess the plating metal layer and bulk material porosity.
format Article
author Yung, L.C.
Fei, C.C.
Mandeep, J.S.
Amin, N.
Lai, K.W.
author_facet Yung, L.C.
Fei, C.C.
Mandeep, J.S.
Amin, N.
Lai, K.W.
author_sort Yung, L.C.
title Bulk substrate porosity verification by applying Monte Carlo modeling and Castaing’s formula using energy-dispersive x-rays
title_short Bulk substrate porosity verification by applying Monte Carlo modeling and Castaing’s formula using energy-dispersive x-rays
title_full Bulk substrate porosity verification by applying Monte Carlo modeling and Castaing’s formula using energy-dispersive x-rays
title_fullStr Bulk substrate porosity verification by applying Monte Carlo modeling and Castaing’s formula using energy-dispersive x-rays
title_full_unstemmed Bulk substrate porosity verification by applying Monte Carlo modeling and Castaing’s formula using energy-dispersive x-rays
title_sort bulk substrate porosity verification by applying monte carlo modeling and castaing’s formula using energy-dispersive x-rays
publisher International Society for Optical Engineering (SPIE)
publishDate 2015
url http://eprints.um.edu.my/19334/
http://dx.doi.org/10.1117/1.JEI.24.6.061105
_version_ 1643690957167656960
score 13.211869

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