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Determination of Traps' Density of State in OLEDs from Current–Voltage Analysis

A simple method to determine the traps density of state (DOS) in organic light-emitting diodes (OLEDs) by manipulating the current-voltage (I-V ) characteristic of the devices at room temperature is introduced. In particular, the trap-dependent space-charge limited current formula is simplified to o...

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Main Authors: Zaini, M.S., Sarjidan, M.A.M., Majid, W.H.A.
Format: Article
Published: Institute of Physics 2016
Subjects:
Q Science (General)
QC Physics
Online Access:http://eprints.um.edu.my/18703/
http://dx.doi.org/10.1088/0256-307X/33/1/018101
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spelling my.um.eprints.187032018-05-16T07:37:52Z http://eprints.um.edu.my/18703/ Determination of Traps' Density of State in OLEDs from Current–Voltage Analysis Zaini, M.S. Sarjidan, M.A.M. Majid, W.H.A. Q Science (General) QC Physics A simple method to determine the traps density of state (DOS) in organic light-emitting diodes (OLEDs) by manipulating the current-voltage (I-V ) characteristic of the devices at room temperature is introduced. In particular, the trap-dependent space-charge limited current formula is simplified to obtain effective density of traps. In this study, poly[(9,9-di-n-octylfluorenyl-2,7-diyl)-alt-(benzo[2,1,3]thiadiazol-4,8-diyl)] (F8BT) and 2- Methoxy-5-(37dimethyloctyloxy) benzene-1,4-diacetonitrile (OC1C10-PPV) are selected as the OLEDs emissive layer. The trap DOS of F8BT- and OC1C10-PPV-based OLEDs are calculated in the magnitudes of 1024 m-3 and 1023 m-3, respectively. In addition, the results agree with the other conventional method which is used to determine the trap DOS in OLEDs. This calculation technique may serve as a robust and reliable approach to obtain the trap DOS in OLEDs at room temperature. Institute of Physics 2016 Article PeerReviewed Zaini, M.S. and Sarjidan, M.A.M. and Majid, W.H.A. (2016) Determination of Traps' Density of State in OLEDs from Current–Voltage Analysis. Chinese Physics Letters, 33 (1). 018101. ISSN 0256-307X http://dx.doi.org/10.1088/0256-307X/33/1/018101 doi:10.1088/0256-307X/33/1/018101
institution Universiti Malaya
building UM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaya
content_source UM Research Repository
url_provider http://eprints.um.edu.my/
topic Q Science (General)
QC Physics
spellingShingle Q Science (General)
QC Physics
Zaini, M.S.
Sarjidan, M.A.M.
Majid, W.H.A.
Determination of Traps' Density of State in OLEDs from Current–Voltage Analysis
description A simple method to determine the traps density of state (DOS) in organic light-emitting diodes (OLEDs) by manipulating the current-voltage (I-V ) characteristic of the devices at room temperature is introduced. In particular, the trap-dependent space-charge limited current formula is simplified to obtain effective density of traps. In this study, poly[(9,9-di-n-octylfluorenyl-2,7-diyl)-alt-(benzo[2,1,3]thiadiazol-4,8-diyl)] (F8BT) and 2- Methoxy-5-(37dimethyloctyloxy) benzene-1,4-diacetonitrile (OC1C10-PPV) are selected as the OLEDs emissive layer. The trap DOS of F8BT- and OC1C10-PPV-based OLEDs are calculated in the magnitudes of 1024 m-3 and 1023 m-3, respectively. In addition, the results agree with the other conventional method which is used to determine the trap DOS in OLEDs. This calculation technique may serve as a robust and reliable approach to obtain the trap DOS in OLEDs at room temperature.
format Article
author Zaini, M.S.
Sarjidan, M.A.M.
Majid, W.H.A.
author_facet Zaini, M.S.
Sarjidan, M.A.M.
Majid, W.H.A.
author_sort Zaini, M.S.
title Determination of Traps' Density of State in OLEDs from Current–Voltage Analysis
title_short Determination of Traps' Density of State in OLEDs from Current–Voltage Analysis
title_full Determination of Traps' Density of State in OLEDs from Current–Voltage Analysis
title_fullStr Determination of Traps' Density of State in OLEDs from Current–Voltage Analysis
title_full_unstemmed Determination of Traps' Density of State in OLEDs from Current–Voltage Analysis
title_sort determination of traps' density of state in oleds from current–voltage analysis
publisher Institute of Physics
publishDate 2016
url http://eprints.um.edu.my/18703/
http://dx.doi.org/10.1088/0256-307X/33/1/018101
_version_ 1643690771412418560
score 13.211869

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