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An SEM flashover: technique to characterize wide band gap insulators

This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of wide band gap insulators. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated insulator surface at once. The charging can...

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Main Authors: Sutjipto, Agus Geter Edy, Muhida, Riza, Takata, Masasuke
Format: Conference or Workshop Item
Language:English
Published: 2006
Subjects:
TK452 Electric apparatus and materials. Electric circuits. Electric networks
Online Access:http://irep.iium.edu.my/9423/1/An_SEM_Flashover_-_IEEE_2006.pdf
http://irep.iium.edu.my/9423/
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spelling my.iium.irep.94232012-04-04T04:13:38Z http://irep.iium.edu.my/9423/ An SEM flashover: technique to characterize wide band gap insulators Sutjipto, Agus Geter Edy Muhida, Riza Takata, Masasuke TK452 Electric apparatus and materials. Electric circuits. Electric networks This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of wide band gap insulators. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated insulator surface at once. The charging can create an electric field distribution in the surface. The increase of electric field at the surface may exceed a critical value when a surface breakdown/flashover occurs. An insulation property can be evaluated by varying the duration of charging/electron bombardment which is needed to initiate an optically-visible flashover treeing formation (hereinafter time to flashover treeing/TTF). In this paper, high purity MgO as a wide band gap insulator material was used as a main investigated sample. Varying addition of high purity SiO2 was used to change insulator property of the MgO. Under a certain SEM's energy and magnification, SiO2 addition has change the duration of charging up to surface breakdown. Therefore, this technique may be useful for investigating an insulation property of materials under electron bombardment such as MgO in a plasma display panel, high voltage insulator, and other insulator materials for space technology. 2006 Conference or Workshop Item REM application/pdf en http://irep.iium.edu.my/9423/1/An_SEM_Flashover_-_IEEE_2006.pdf Sutjipto, Agus Geter Edy and Muhida, Riza and Takata, Masasuke (2006) An SEM flashover: technique to characterize wide band gap insulators. In: 8th International Conference on Properties and Applications of Dielectric Materials, 26 - 30 June 2006, Bali, Indonesia.
institution Universiti Islam Antarabangsa Malaysia
building IIUM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider International Islamic University Malaysia
content_source IIUM Repository (IREP)
url_provider http://irep.iium.edu.my/
language English
topic TK452 Electric apparatus and materials. Electric circuits. Electric networks
spellingShingle TK452 Electric apparatus and materials. Electric circuits. Electric networks
Sutjipto, Agus Geter Edy
Muhida, Riza
Takata, Masasuke
An SEM flashover: technique to characterize wide band gap insulators
description This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of wide band gap insulators. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated insulator surface at once. The charging can create an electric field distribution in the surface. The increase of electric field at the surface may exceed a critical value when a surface breakdown/flashover occurs. An insulation property can be evaluated by varying the duration of charging/electron bombardment which is needed to initiate an optically-visible flashover treeing formation (hereinafter time to flashover treeing/TTF). In this paper, high purity MgO as a wide band gap insulator material was used as a main investigated sample. Varying addition of high purity SiO2 was used to change insulator property of the MgO. Under a certain SEM's energy and magnification, SiO2 addition has change the duration of charging up to surface breakdown. Therefore, this technique may be useful for investigating an insulation property of materials under electron bombardment such as MgO in a plasma display panel, high voltage insulator, and other insulator materials for space technology.
format Conference or Workshop Item
author Sutjipto, Agus Geter Edy
Muhida, Riza
Takata, Masasuke
author_facet Sutjipto, Agus Geter Edy
Muhida, Riza
Takata, Masasuke
author_sort Sutjipto, Agus Geter Edy
title An SEM flashover: technique to characterize wide band gap insulators
title_short An SEM flashover: technique to characterize wide band gap insulators
title_full An SEM flashover: technique to characterize wide band gap insulators
title_fullStr An SEM flashover: technique to characterize wide band gap insulators
title_full_unstemmed An SEM flashover: technique to characterize wide band gap insulators
title_sort sem flashover: technique to characterize wide band gap insulators
publishDate 2006
url http://irep.iium.edu.my/9423/1/An_SEM_Flashover_-_IEEE_2006.pdf
http://irep.iium.edu.my/9423/
_version_ 1643606265980518400
score 13.211869

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