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Novel characterization technique by using an SEM

Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron...

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Main Authors: Sutjipto, Agus Geter Edy, -, Jufriadi, Muhida, Riza, Takata, Masasuke
Format: Conference or Workshop Item
Language:English
Published: 2008
Subjects:
TK452 Electric apparatus and materials. Electric circuits. Electric networks
Online Access:http://irep.iium.edu.my/9393/1/AGUS_-_Proc_ISDEV_-_2008.pdf
http://irep.iium.edu.my/9393/
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spelling my.iium.irep.93932012-04-06T07:18:53Z http://irep.iium.edu.my/9393/ Novel characterization technique by using an SEM Sutjipto, Agus Geter Edy -, Jufriadi Muhida, Riza Takata, Masasuke TK452 Electric apparatus and materials. Electric circuits. Electric networks Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron beam to charge an insulator without metallic coating and to produce a surface discharging (surface breakdown/flashover) but also to observe the visible charging and discharging on the sample surface. A model of electric field distribution on the surface was developed in order to explain charging and discharging phenomena. Since charging and discharging process involves incubation time, therefore this process can be used to characterize or evaluate the insulation property of materials under electron bombardment. 2008 Conference or Workshop Item REM application/pdf en http://irep.iium.edu.my/9393/1/AGUS_-_Proc_ISDEV_-_2008.pdf Sutjipto, Agus Geter Edy and -, Jufriadi and Muhida, Riza and Takata, Masasuke (2008) Novel characterization technique by using an SEM. In: XXIII-rd Int. Symp. on Discharges and Electrical Insulation in Vacuum (ISDEIV 2008), 15 - 19 September 2008, Bucharest, Romania.
institution Universiti Islam Antarabangsa Malaysia
building IIUM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider International Islamic University Malaysia
content_source IIUM Repository (IREP)
url_provider http://irep.iium.edu.my/
language English
topic TK452 Electric apparatus and materials. Electric circuits. Electric networks
spellingShingle TK452 Electric apparatus and materials. Electric circuits. Electric networks
Sutjipto, Agus Geter Edy
-, Jufriadi
Muhida, Riza
Takata, Masasuke
Novel characterization technique by using an SEM
description Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron beam to charge an insulator without metallic coating and to produce a surface discharging (surface breakdown/flashover) but also to observe the visible charging and discharging on the sample surface. A model of electric field distribution on the surface was developed in order to explain charging and discharging phenomena. Since charging and discharging process involves incubation time, therefore this process can be used to characterize or evaluate the insulation property of materials under electron bombardment.
format Conference or Workshop Item
author Sutjipto, Agus Geter Edy
-, Jufriadi
Muhida, Riza
Takata, Masasuke
author_facet Sutjipto, Agus Geter Edy
-, Jufriadi
Muhida, Riza
Takata, Masasuke
author_sort Sutjipto, Agus Geter Edy
title Novel characterization technique by using an SEM
title_short Novel characterization technique by using an SEM
title_full Novel characterization technique by using an SEM
title_fullStr Novel characterization technique by using an SEM
title_full_unstemmed Novel characterization technique by using an SEM
title_sort novel characterization technique by using an sem
publishDate 2008
url http://irep.iium.edu.my/9393/1/AGUS_-_Proc_ISDEV_-_2008.pdf
http://irep.iium.edu.my/9393/
_version_ 1643606261904703488
score 13.211869

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