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Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes

A spiral scanning method for high-speed Atomic Force Microscopy (AFM) is described in this paper. In this method, the sample is scanned in a spiral pattern instead of the conventional raster pattern. A spiral scan can be produced by applying single frequency cosine and sine signals with slowly varyi...

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Main Authors: Mahmood, Iskandar Al-Thani, Moheimani, S.O. Reza
Format: Conference or Workshop Item
Language:English
Published: 2010
Subjects:
Q Science (General)
TJ212 Control engineering
Online Access:http://irep.iium.edu.my/5304/1/Spiral_scanning_-_An_alternative_to_conventional_raster_scanning_in_high-speed_Scanning_Probe_Microscopes.pdf
http://irep.iium.edu.my/5304/
http://a2c2.org/conferences/acc2010/
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spelling my.iium.irep.53042011-10-31T07:50:45Z http://irep.iium.edu.my/5304/ Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza Q Science (General) TJ212 Control engineering A spiral scanning method for high-speed Atomic Force Microscopy (AFM) is described in this paper. In this method, the sample is scanned in a spiral pattern instead of the conventional raster pattern. A spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying amplitudes to the x axis and y axis of an AFM scanner respectively. The use of the single tone input signals allows the scanner to move at high speeds without exciting the mechanical resonance of the device and with relatively small control efforts. These scan methods can be incorporated into most modern AFMs with minimal effort since they can be implemented in software using the existing hardware. Experimental results obtained by implementing this scanning method on a commercial AFM indicate that the obtained images are of a good quality and the profile of the calibration grating is well captured up to scan frequency of 120 Hz with a scanner where the first resonance frequency is 580 Hz. 2010-06 Conference or Workshop Item REM application/pdf en http://irep.iium.edu.my/5304/1/Spiral_scanning_-_An_alternative_to_conventional_raster_scanning_in_high-speed_Scanning_Probe_Microscopes.pdf Mahmood, Iskandar Al-Thani and Moheimani, S.O. Reza (2010) Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes. In: American Control Conference (ACC), 30 June - 2 July 2010, Marriott Waterfront, Baltimore, MD, USA. http://a2c2.org/conferences/acc2010/
institution Universiti Islam Antarabangsa Malaysia
building IIUM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider International Islamic University Malaysia
content_source IIUM Repository (IREP)
url_provider http://irep.iium.edu.my/
language English
topic Q Science (General)
TJ212 Control engineering
spellingShingle Q Science (General)
TJ212 Control engineering
Mahmood, Iskandar Al-Thani
Moheimani, S.O. Reza
Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes
description A spiral scanning method for high-speed Atomic Force Microscopy (AFM) is described in this paper. In this method, the sample is scanned in a spiral pattern instead of the conventional raster pattern. A spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying amplitudes to the x axis and y axis of an AFM scanner respectively. The use of the single tone input signals allows the scanner to move at high speeds without exciting the mechanical resonance of the device and with relatively small control efforts. These scan methods can be incorporated into most modern AFMs with minimal effort since they can be implemented in software using the existing hardware. Experimental results obtained by implementing this scanning method on a commercial AFM indicate that the obtained images are of a good quality and the profile of the calibration grating is well captured up to scan frequency of 120 Hz with a scanner where the first resonance frequency is 580 Hz.
format Conference or Workshop Item
author Mahmood, Iskandar Al-Thani
Moheimani, S.O. Reza
author_facet Mahmood, Iskandar Al-Thani
Moheimani, S.O. Reza
author_sort Mahmood, Iskandar Al-Thani
title Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes
title_short Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes
title_full Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes
title_fullStr Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes
title_full_unstemmed Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes
title_sort spiral scanning: an alternative to conventional raster scanning in high-speed scanning probe microscopes
publishDate 2010
url http://irep.iium.edu.my/5304/1/Spiral_scanning_-_An_alternative_to_conventional_raster_scanning_in_high-speed_Scanning_Probe_Microscopes.pdf
http://irep.iium.edu.my/5304/
http://a2c2.org/conferences/acc2010/
_version_ 1643605510996361216
score 13.211869

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