A novel intelligent based controller for fast atomic force microscopy

Piezoelectric tube scanner is a major component that used in nanoscale imaging tools such as atomic force microscopy (AFM). This is because it can provide precise nanoscale positioning. However the precision is limited by vibration and some nonlinear drawbacks represented by hysteresis and creep. Hy...

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Bibliographic Details
Main Author: Mahmood, Iskandar Al-Thani
Format: Monograph
Language:English
Published: IIUM Press 2015
Subjects:
Online Access:http://irep.iium.edu.my/42747/1/RESEARCH_REPORT_-_EDW_B11-119-0597.pdf
http://irep.iium.edu.my/42747/
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