A modular system of deep level transient spectroscopy
Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequenc...
保存先:
| 主要な著者: | , |
|---|---|
| フォーマット: | Conference or Workshop Item |
| 言語: | English |
| 出版事項: |
2011
|
| 主題: | |
| オンライン･アクセス: | http://irep.iium.edu.my/36427/1/iccaie.pdf http://irep.iium.edu.my/36427/ http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6162137&tag=1 |
| タグ: |
タグ追加
タグなし, このレコードへの初めてのタグを付けませんか!
|