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A modular system of deep level transient spectroscopy

Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequenc...

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Main Authors: Rusli, Nazreen, Debuf, Didier
Format: Conference or Workshop Item
Language:English
Published: 2011
Subjects:
QC Physics
Online Access:http://irep.iium.edu.my/36427/1/iccaie.pdf
http://irep.iium.edu.my/36427/
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6162137&tag=1
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spelling my.iium.irep.364272014-04-25T07:30:30Z http://irep.iium.edu.my/36427/ A modular system of deep level transient spectroscopy Rusli, Nazreen Debuf, Didier QC Physics Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequency Deep Level Transient Spectroscopy (FFDLTS) is proposed as one of the methods to analyze the defect level depth. 2011-12-04 Conference or Workshop Item REM application/pdf en http://irep.iium.edu.my/36427/1/iccaie.pdf Rusli, Nazreen and Debuf, Didier (2011) A modular system of deep level transient spectroscopy. In: 2011 IEEE International Conference on Computer Applications and Industrial Electronics (ICCAIE 2011), 4-7 Dec. 2011, Penang. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6162137&tag=1
institution Universiti Islam Antarabangsa Malaysia
building IIUM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider International Islamic University Malaysia
content_source IIUM Repository (IREP)
url_provider http://irep.iium.edu.my/
language English
topic QC Physics
spellingShingle QC Physics
Rusli, Nazreen
Debuf, Didier
A modular system of deep level transient spectroscopy
description Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequency Deep Level Transient Spectroscopy (FFDLTS) is proposed as one of the methods to analyze the defect level depth.
format Conference or Workshop Item
author Rusli, Nazreen
Debuf, Didier
author_facet Rusli, Nazreen
Debuf, Didier
author_sort Rusli, Nazreen
title A modular system of deep level transient spectroscopy
title_short A modular system of deep level transient spectroscopy
title_full A modular system of deep level transient spectroscopy
title_fullStr A modular system of deep level transient spectroscopy
title_full_unstemmed A modular system of deep level transient spectroscopy
title_sort modular system of deep level transient spectroscopy
publishDate 2011
url http://irep.iium.edu.my/36427/1/iccaie.pdf
http://irep.iium.edu.my/36427/
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6162137&tag=1
_version_ 1643610988807716864
score 13.211869

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