A modular system of deep level transient spectroscopy
Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequenc...
Saved in:
| Main Authors: | , |
|---|---|
| 格式: | Conference or Workshop Item |
| 語言: | English |
| 出版: |
2011
|
| 主題: | |
| 在線閱讀: | http://irep.iium.edu.my/36427/1/iccaie.pdf http://irep.iium.edu.my/36427/ http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6162137&tag=1 |
| 標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|