A modular system of deep level transient spectroscopy
Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequenc...
Saved in:
| Main Authors: | , |
|---|---|
| 格式: | Conference or Workshop Item |
| 語言: | English |
| 出版: |
2011
|
| 主題: | |
| 在線閱讀: | http://irep.iium.edu.my/36427/1/iccaie.pdf http://irep.iium.edu.my/36427/ http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6162137&tag=1 |
| 標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
| id |
my.iium.irep.36427 |
|---|---|
| record_format |
dspace |
| spelling |
my.iium.irep.364272014-04-25T07:30:30Z http://irep.iium.edu.my/36427/ A modular system of deep level transient spectroscopy Rusli, Nazreen Debuf, Didier QC Physics Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequency Deep Level Transient Spectroscopy (FFDLTS) is proposed as one of the methods to analyze the defect level depth. 2011-12-04 Conference or Workshop Item REM application/pdf en http://irep.iium.edu.my/36427/1/iccaie.pdf Rusli, Nazreen and Debuf, Didier (2011) A modular system of deep level transient spectroscopy. In: 2011 IEEE International Conference on Computer Applications and Industrial Electronics (ICCAIE 2011), 4-7 Dec. 2011, Penang. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6162137&tag=1 |
| institution |
Universiti Islam Antarabangsa Malaysia |
| building |
IIUM Library |
| collection |
Institutional Repository |
| continent |
Asia |
| country |
Malaysia |
| content_provider |
International Islamic University Malaysia |
| content_source |
IIUM Repository (IREP) |
| url_provider |
http://irep.iium.edu.my/ |
| language |
English |
| topic |
QC Physics |
| spellingShingle |
QC Physics Rusli, Nazreen Debuf, Didier A modular system of deep level transient spectroscopy |
| description |
Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequency Deep Level Transient Spectroscopy (FFDLTS) is proposed as one of the methods to analyze the defect level depth. |
| format |
Conference or Workshop Item |
| author |
Rusli, Nazreen Debuf, Didier |
| author_facet |
Rusli, Nazreen Debuf, Didier |
| author_sort |
Rusli, Nazreen |
| title |
A modular system of deep level transient spectroscopy |
| title_short |
A modular system of deep level transient spectroscopy |
| title_full |
A modular system of deep level transient spectroscopy |
| title_fullStr |
A modular system of deep level transient spectroscopy |
| title_full_unstemmed |
A modular system of deep level transient spectroscopy |
| title_sort |
modular system of deep level transient spectroscopy |
| publishDate |
2011 |
| url |
http://irep.iium.edu.my/36427/1/iccaie.pdf http://irep.iium.edu.my/36427/ http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6162137&tag=1 |
| _version_ |
1643610988807716864 |
| score |
13.251813 |