Design of capacitive measuring systems for high frequency band sensor transducer
A 0.13-μm complementary metal-oxide-semiconductor (CMOS) technology capacitive measuring system has been proposed for detection a wide range of capacitance variation values by using less than 1.2-V supply voltage. Simulation results have successfully verified the function of the design is able to me...
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| Main Authors: | , , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2010
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/3384/1/05556850.pdf http://irep.iium.edu.my/3384/ http://dx.doi.org/10.1109/ICCCE.2010.5556850 |
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