Structure characterization of electrodeposited zinc selenide thin films
Crystalline thin of zinc selenide have been electrochemically deposited on conducting substrates of indium tin oxide, ITO glass. Initial investigation with voltammetry was done and shows that the zinc selenide films were stable towards oxidation. The best deposition potential obtained was at -0.95...
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2011
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my.iium.irep.33702013-06-27T08:03:40Z http://irep.iium.edu.my/3370/ Structure characterization of electrodeposited zinc selenide thin films Mohamad, Souad A. Basirun, Wan Jefrey Ibrahim, Zainol Abidin Mohd Arof, Abdul Kariem Ebadi, Mehdi TK2896 Production of electricity by direct energy conversion Crystalline thin of zinc selenide have been electrochemically deposited on conducting substrates of indium tin oxide, ITO glass. Initial investigation with voltammetry was done and shows that the zinc selenide films were stable towards oxidation. The best deposition potential obtained was at -0.95 V vs. Ag /AgCl while at lower deposition potentials, the films do not form well. Energy Dispersive Analysis and X-Ray spectrum indicate that the films deposited at 65oC and -0.95 V vs. Ag/AgCl have nearly stoichiometric Zn: Se ratio. Trans Tech Publications, Switzerland 2011-06-30 Article REM application/pdf en http://irep.iium.edu.my/3370/1/AMR.264-265.732.pdf Mohamad, Souad A. and Basirun, Wan Jefrey and Ibrahim, Zainol Abidin and Mohd Arof, Abdul Kariem and Ebadi, Mehdi (2011) Structure characterization of electrodeposited zinc selenide thin films. Advanced Materials Research, 264. pp. 732-737. ISSN 1022-6680 http://www.scientific.net 10.4028/www.scientific.net/AMR.264-265.732 |
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TK2896 Production of electricity by direct energy conversion Mohamad, Souad A. Basirun, Wan Jefrey Ibrahim, Zainol Abidin Mohd Arof, Abdul Kariem Ebadi, Mehdi Structure characterization of electrodeposited zinc selenide thin films |
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Crystalline thin of zinc selenide have been electrochemically deposited on conducting substrates of indium tin oxide, ITO glass. Initial investigation with voltammetry was done and shows that the zinc selenide films were stable towards oxidation. The best deposition potential
obtained was at -0.95 V vs. Ag /AgCl while at lower deposition potentials, the films do not form well. Energy Dispersive Analysis and X-Ray spectrum indicate that the films deposited at 65oC and -0.95 V vs. Ag/AgCl have nearly stoichiometric Zn: Se ratio. |
format |
Article |
author |
Mohamad, Souad A. Basirun, Wan Jefrey Ibrahim, Zainol Abidin Mohd Arof, Abdul Kariem Ebadi, Mehdi |
author_facet |
Mohamad, Souad A. Basirun, Wan Jefrey Ibrahim, Zainol Abidin Mohd Arof, Abdul Kariem Ebadi, Mehdi |
author_sort |
Mohamad, Souad A. |
title |
Structure characterization of electrodeposited zinc
selenide thin films
|
title_short |
Structure characterization of electrodeposited zinc
selenide thin films
|
title_full |
Structure characterization of electrodeposited zinc
selenide thin films
|
title_fullStr |
Structure characterization of electrodeposited zinc
selenide thin films
|
title_full_unstemmed |
Structure characterization of electrodeposited zinc
selenide thin films
|
title_sort |
structure characterization of electrodeposited zinc
selenide thin films |
publisher |
Trans Tech Publications, Switzerland |
publishDate |
2011 |
url |
http://irep.iium.edu.my/3370/1/AMR.264-265.732.pdf http://irep.iium.edu.my/3370/ http://www.scientific.net |
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1643605129524412416 |
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13.211869 |